Design for at-speed test, diagnosis, and measurement:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer Academic
c2000
|
| Schriftenreihe: | Frontiers in electronic testing
|
| Schlagworte: | |
| Beschreibung: | xvii, 239 p. |
| ISBN: | 0792386698 |
Internformat
MARC
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| 001 | BV044830884 | ||
| 003 | DE-604 | ||
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| 008 | 180305s2000 |||| o||u| ||||||eng d | ||
| 020 | |a 0792386698 |c alk. paper |9 0-7923-8669-8 | ||
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| 035 | |a (OCoLC)559345691 | ||
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| 245 | 1 | 0 | |a Design for at-speed test, diagnosis, and measurement |c edited by Benoit Nadeau-Dostie |
| 264 | 1 | |a Boston |b Kluwer Academic |c c2000 | |
| 300 | |a xvii, 239 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing | |
| 505 | 8 | |a Includes bibliographical references | |
| 650 | 4 | |a Integrated circuits |x Testing | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing | |
| 700 | 1 | |a Nadeau-Dostie, Benoit |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030225749 | ||
Datensatz im Suchindex
| _version_ | 1804178331884584960 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044830884 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references |
| ctrlnum | (ZDB-38-ESG)ebr10052637 (OCoLC)559345691 (DE-599)BVBBV044830884 |
| dewey-full | 621.385 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.385 |
| dewey-search | 621.385 |
| dewey-sort | 3621.385 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044830884 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:17Z |
| institution | BVB |
| isbn | 0792386698 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030225749 |
| oclc_num | 559345691 |
| open_access_boolean | |
| physical | xvii, 239 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Kluwer Academic |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | Design for at-speed test, diagnosis, and measurement edited by Benoit Nadeau-Dostie Boston Kluwer Academic c2000 xvii, 239 p. txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing Includes bibliographical references Integrated circuits Testing Electronic apparatus and appliances Testing Nadeau-Dostie, Benoit Sonstige oth |
| spellingShingle | Design for at-speed test, diagnosis, and measurement Includes bibliographical references Integrated circuits Testing Electronic apparatus and appliances Testing |
| title | Design for at-speed test, diagnosis, and measurement |
| title_auth | Design for at-speed test, diagnosis, and measurement |
| title_exact_search | Design for at-speed test, diagnosis, and measurement |
| title_full | Design for at-speed test, diagnosis, and measurement edited by Benoit Nadeau-Dostie |
| title_fullStr | Design for at-speed test, diagnosis, and measurement edited by Benoit Nadeau-Dostie |
| title_full_unstemmed | Design for at-speed test, diagnosis, and measurement edited by Benoit Nadeau-Dostie |
| title_short | Design for at-speed test, diagnosis, and measurement |
| title_sort | design for at speed test diagnosis and measurement |
| topic | Integrated circuits Testing Electronic apparatus and appliances Testing |
| topic_facet | Integrated circuits Testing Electronic apparatus and appliances Testing |
| work_keys_str_mv | AT nadeaudostiebenoit designforatspeedtestdiagnosisandmeasurement |