Growth monitoring of ultrathin copper and copper oxide films deposited by atomic layer deposition:
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Bibliographic Details
Main Author: Dhakal, Dileep 1986- (Author)
Format: Thesis Book
Language:English
German
Published: Chemnitz Technische Universität Chemnitz 2016
Subjects:
Physical Description:171 Blätter Illustrationen, Diagramme

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!