Industrial tomography: systems and applications
Includes bibliographical references and index
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier, Woodhead Publishing
[2015]
|
| Schriftenreihe: | Woodhead publishing series in electronic and optical materials
number 71 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Zusammenfassung: | Includes bibliographical references and index |
| Beschreibung: | xxvii, 744 Seiten Ill., graph. Darst |
| ISBN: | 9781782421184 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV044793951 | ||
| 003 | DE-604 | ||
| 005 | 20180309 | ||
| 007 | t | ||
| 008 | 180223s2015 ad|| |||| 00||| eng d | ||
| 020 | |a 9781782421184 |9 978-1-78242-118-4 | ||
| 035 | |a (OCoLC)913609142 | ||
| 035 | |a (DE-599)OBVAC12406264 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 084 | |a UQ 8010 |0 (DE-625)146585: |2 rvk | ||
| 084 | |a 51.30 |2 bkl | ||
| 245 | 1 | 0 | |a Industrial tomography |b systems and applications |c edited by Mi Wang |
| 264 | 1 | |a Amsterdam |b Elsevier, Woodhead Publishing |c [2015] | |
| 300 | |a xxvii, 744 Seiten |b Ill., graph. Darst | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Woodhead publishing series in electronic and optical materials |v number 71 | |
| 520 | 3 | |a Includes bibliographical references and index | |
| 650 | 0 | 7 | |a Computertomografie |0 (DE-588)4113240-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Tomografie |0 (DE-588)4078351-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
| 689 | 0 | 1 | |a Computertomografie |0 (DE-588)4113240-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Tomografie |0 (DE-588)4078351-0 |D s |
| 689 | 1 | 1 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Wang, Mi |0 (DE-588)1019111429 |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-1-78242-123-8 |
| 830 | 0 | |a Woodhead publishing series in electronic and optical materials |v number 71 |w (DE-604)BV040604945 |9 71 | |
| 856 | 4 | 2 | |m V:DE-601;B:DE-89 |q application/pdf |u http://www.gbv.de/dms/tib-ub-hannover/833340077.pdf |y Inhaltsverzeichnis |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030189079 | ||
Datensatz im Suchindex
| _version_ | 1804178307367829504 |
|---|---|
| any_adam_object | |
| author2 | Wang, Mi |
| author2_role | edt |
| author2_variant | m w mw |
| author_GND | (DE-588)1019111429 |
| author_facet | Wang, Mi |
| building | Verbundindex |
| bvnumber | BV044793951 |
| classification_rvk | UQ 8010 |
| ctrlnum | (OCoLC)913609142 (DE-599)OBVAC12406264 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01826nam a2200445 cb4500</leader><controlfield tag="001">BV044793951</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180309 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">180223s2015 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781782421184</subfield><subfield code="9">978-1-78242-118-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)913609142</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)OBVAC12406264</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8010</subfield><subfield code="0">(DE-625)146585:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.30</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Industrial tomography</subfield><subfield code="b">systems and applications</subfield><subfield code="c">edited by Mi Wang</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Elsevier, Woodhead Publishing</subfield><subfield code="c">[2015]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxvii, 744 Seiten</subfield><subfield code="b">Ill., graph. Darst</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Woodhead publishing series in electronic and optical materials</subfield><subfield code="v">number 71</subfield></datafield><datafield tag="520" ind1="3" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computertomografie</subfield><subfield code="0">(DE-588)4113240-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Tomografie</subfield><subfield code="0">(DE-588)4078351-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Computertomografie</subfield><subfield code="0">(DE-588)4113240-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Tomografie</subfield><subfield code="0">(DE-588)4078351-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wang, Mi</subfield><subfield code="0">(DE-588)1019111429</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-1-78242-123-8</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Woodhead publishing series in electronic and optical materials</subfield><subfield code="v">number 71</subfield><subfield code="w">(DE-604)BV040604945</subfield><subfield code="9">71</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">V:DE-601;B:DE-89</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://www.gbv.de/dms/tib-ub-hannover/833340077.pdf</subfield><subfield code="y">Inhaltsverzeichnis</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030189079</subfield></datafield></record></collection> |
| id | DE-604.BV044793951 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:01:53Z |
| institution | BVB |
| isbn | 9781782421184 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030189079 |
| oclc_num | 913609142 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | xxvii, 744 Seiten Ill., graph. Darst |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Elsevier, Woodhead Publishing |
| record_format | marc |
| series | Woodhead publishing series in electronic and optical materials |
| series2 | Woodhead publishing series in electronic and optical materials |
| spelling | Industrial tomography systems and applications edited by Mi Wang Amsterdam Elsevier, Woodhead Publishing [2015] xxvii, 744 Seiten Ill., graph. Darst txt rdacontent n rdamedia nc rdacarrier Woodhead publishing series in electronic and optical materials number 71 Includes bibliographical references and index Computertomografie (DE-588)4113240-3 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf Tomografie (DE-588)4078351-0 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s Computertomografie (DE-588)4113240-3 s DE-604 Tomografie (DE-588)4078351-0 s Wang, Mi (DE-588)1019111429 edt Erscheint auch als Online-Ausgabe 978-1-78242-123-8 Woodhead publishing series in electronic and optical materials number 71 (DE-604)BV040604945 71 V:DE-601;B:DE-89 application/pdf http://www.gbv.de/dms/tib-ub-hannover/833340077.pdf Inhaltsverzeichnis Inhaltsverzeichnis |
| spellingShingle | Industrial tomography systems and applications Woodhead publishing series in electronic and optical materials Computertomografie (DE-588)4113240-3 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Tomografie (DE-588)4078351-0 gnd |
| subject_GND | (DE-588)4113240-3 (DE-588)4067689-4 (DE-588)4078351-0 |
| title | Industrial tomography systems and applications |
| title_auth | Industrial tomography systems and applications |
| title_exact_search | Industrial tomography systems and applications |
| title_full | Industrial tomography systems and applications edited by Mi Wang |
| title_fullStr | Industrial tomography systems and applications edited by Mi Wang |
| title_full_unstemmed | Industrial tomography systems and applications edited by Mi Wang |
| title_short | Industrial tomography |
| title_sort | industrial tomography systems and applications |
| title_sub | systems and applications |
| topic | Computertomografie (DE-588)4113240-3 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Tomografie (DE-588)4078351-0 gnd |
| topic_facet | Computertomografie Zerstörungsfreie Werkstoffprüfung Tomografie |
| url | http://www.gbv.de/dms/tib-ub-hannover/833340077.pdf |
| volume_link | (DE-604)BV040604945 |
| work_keys_str_mv | AT wangmi industrialtomographysystemsandapplications |