Measurement techniques for radio frequency nanoelectronics:
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
2017
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| Schriftenreihe: | The Cambridge RF and microwave engineering series
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| Schlagworte: | |
| Online-Zugang: | BSB01 FHN01 URL des Erstveröffentlichers |
| Zusammenfassung: | Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics |
| Beschreibung: | Title from publisher's bibliographic system (viewed on 15 Sep 2017) |
| Beschreibung: | 1 online resource (xiv, 314 pages) |
| ISBN: | 9781316343098 |
| DOI: | 10.1017/9781316343098 |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:00:31Z |
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| isbn | 9781316343098 |
| language | English |
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| spelling | Wallis, T. Mitch Verfasser (DE-588)1171844557 aut Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder Cambridge Cambridge University Press 2017 1 online resource (xiv, 314 pages) txt rdacontent c rdamedia cr rdacarrier The Cambridge RF and microwave engineering series Title from publisher's bibliographic system (viewed on 15 Sep 2017) Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics Nanoelektronik (DE-588)4732034-5 gnd rswk-swf Nanoelektronik (DE-588)4732034-5 s 1\p DE-604 Kaboš, Pavel Sonstige (DE-588)1171844832 oth Erscheint auch als Druck-Ausgabe 9781107120686 https://doi.org/10.1017/9781316343098 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wallis, T. Mitch Measurement techniques for radio frequency nanoelectronics Nanoelektronik (DE-588)4732034-5 gnd |
| subject_GND | (DE-588)4732034-5 |
| title | Measurement techniques for radio frequency nanoelectronics |
| title_auth | Measurement techniques for radio frequency nanoelectronics |
| title_exact_search | Measurement techniques for radio frequency nanoelectronics |
| title_full | Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| title_fullStr | Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| title_full_unstemmed | Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| title_short | Measurement techniques for radio frequency nanoelectronics |
| title_sort | measurement techniques for radio frequency nanoelectronics |
| topic | Nanoelektronik (DE-588)4732034-5 gnd |
| topic_facet | Nanoelektronik |
| url | https://doi.org/10.1017/9781316343098 |
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