Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Springer Singapore
2018
|
| Schriftenreihe: | SpringerBriefs in Applied Sciences and Technology
|
| Schlagworte: | |
| Online-Zugang: | BTU01 TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XII, 137 p. 53 illus., 20 illus. in color) |
| ISBN: | 9789811044335 |
| ISSN: | 2191-530X |
| DOI: | 10.1007/978-981-10-4433-5 |
Internformat
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| 245 | 1 | 0 | |a Field Emission Scanning Electron Microscopy |b New Perspectives for Materials Characterization |c by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin |
| 264 | 1 | |a Singapore |b Springer Singapore |c 2018 | |
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| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Nanotechnology and Microengineering | |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Brodusch, Nicolas |
| author_facet | Brodusch, Nicolas |
| author_role | aut |
| author_sort | Brodusch, Nicolas |
| author_variant | n b nb |
| building | Verbundindex |
| bvnumber | BV044703148 |
| classification_tum | CHE 000 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)9789811044335 (OCoLC)1009086326 (DE-599)BVBBV044703148 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie |
| doi_str_mv | 10.1007/978-981-10-4433-5 |
| format | Electronic eBook |
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| id | DE-604.BV044703148 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:59:48Z |
| institution | BVB |
| isbn | 9789811044335 |
| issn | 2191-530X |
| language | English |
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| physical | 1 Online-Ressource (XII, 137 p. 53 illus., 20 illus. in color) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2018 |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer Singapore |
| record_format | marc |
| series2 | SpringerBriefs in Applied Sciences and Technology |
| spelling | Brodusch, Nicolas Verfasser aut Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin Singapore Springer Singapore 2018 1 Online-Ressource (XII, 137 p. 53 illus., 20 illus. in color) txt rdacontent c rdamedia cr rdacarrier SpringerBriefs in Applied Sciences and Technology 2191-530X Materials science Spectroscopy Microscopy Nanotechnology Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering Demers, Hendrix Sonstige oth Gauvin, Raynald Sonstige oth Erscheint auch als Druck-Ausgabe 978-981-10-4432-8 https://doi.org/10.1007/978-981-10-4433-5 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Brodusch, Nicolas Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization Materials science Spectroscopy Microscopy Nanotechnology Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering |
| title | Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization |
| title_auth | Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization |
| title_exact_search | Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization |
| title_full | Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin |
| title_fullStr | Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin |
| title_full_unstemmed | Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin |
| title_short | Field Emission Scanning Electron Microscopy |
| title_sort | field emission scanning electron microscopy new perspectives for materials characterization |
| title_sub | New Perspectives for Materials Characterization |
| topic | Materials science Spectroscopy Microscopy Nanotechnology Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering |
| topic_facet | Materials science Spectroscopy Microscopy Nanotechnology Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering |
| url | https://doi.org/10.1007/978-981-10-4433-5 |
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