APA (7th ed.) Citation

Goldstein, J., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning electron microscopy and x-ray microanalysis (Forth edition.). Springer. https://doi.org/10.1007/978-1-4939-6676-9

Chicago Style (17th ed.) Citation

Goldstein, Joseph, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. Scanning Electron Microscopy and X-ray Microanalysis. Forth edition. New York: Springer, 2018. https://doi.org/10.1007/978-1-4939-6676-9.

MLA (9th ed.) Citation

Goldstein, Joseph, et al. Scanning Electron Microscopy and X-ray Microanalysis. Forth edition. Springer, 2018. https://doi.org/10.1007/978-1-4939-6676-9.