Contactless VLSI Measurement and Testing Techniques:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2018
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| Schlagworte: | |
| Online-Zugang: | BTU01 FAW01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (V, 93 p. 34 illus., 11 illus. in color) |
| ISBN: | 9783319696737 |
| DOI: | 10.1007/978-3-319-69673-7 |
Internformat
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Datensatz im Suchindex
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| _version_ | 1824554652159442945 |
| any_adam_object | |
| author | Sayil, Selahattin |
| author_facet | Sayil, Selahattin |
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| author_variant | s s ss |
| building | Verbundindex |
| bvnumber | BV044661848 |
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| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| dewey-search | 621.3815 |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-319-69673-7 |
| format | Electronic eBook |
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| id | DE-604.BV044661848 |
| illustrated | Not Illustrated |
| indexdate | 2025-02-20T06:55:10Z |
| institution | BVB |
| isbn | 9783319696737 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030059351 |
| oclc_num | 1013882138 |
| open_access_boolean | |
| owner | DE-861 DE-1046 DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-Aug4 DE-862 DE-BY-FWS DE-863 DE-BY-FWS DE-634 DE-523 DE-706 DE-91 DE-BY-TUM DE-860 DE-573 |
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| physical | 1 Online-Ressource (V, 93 p. 34 illus., 11 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2018 |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer International Publishing |
| record_format | marc |
| spellingShingle | Sayil, Selahattin Contactless VLSI Measurement and Testing Techniques Engineering Microprocessors Electronics Microelectronics Electronic circuits Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation |
| title | Contactless VLSI Measurement and Testing Techniques |
| title_auth | Contactless VLSI Measurement and Testing Techniques |
| title_exact_search | Contactless VLSI Measurement and Testing Techniques |
| title_full | Contactless VLSI Measurement and Testing Techniques by Selahattin Sayil |
| title_fullStr | Contactless VLSI Measurement and Testing Techniques by Selahattin Sayil |
| title_full_unstemmed | Contactless VLSI Measurement and Testing Techniques by Selahattin Sayil |
| title_short | Contactless VLSI Measurement and Testing Techniques |
| title_sort | contactless vlsi measurement and testing techniques |
| topic | Engineering Microprocessors Electronics Microelectronics Electronic circuits Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation |
| topic_facet | Engineering Microprocessors Electronics Microelectronics Electronic circuits Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation |
| url | https://doi.org/10.1007/978-3-319-69673-7 |
| work_keys_str_mv | AT sayilselahattin contactlessvlsimeasurementandtestingtechniques |