Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: a Scanning Probe Microscopy Approach
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2018]
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| Schriftenreihe: | Springer Theses, Recognizing Outstanding Ph.D. Research
|
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 UER01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (XXI, 122 p. 67 illus., 14 illus. in color) |
| ISBN: | 9783319701813 |
| DOI: | 10.1007/978-3-319-70181-3 |
Internformat
MARC
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| 100 | 1 | |a Kay, Nicholas D. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals |b a Scanning Probe Microscopy Approach |c Nicholas D. Kay |
| 264 | 1 | |a Cham |b Springer |c [2018] | |
| 300 | |a 1 Online-Ressource (XXI, 122 p. 67 illus., 14 illus. in color) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Springer Theses, Recognizing Outstanding Ph.D. Research | |
| 502 | |b Dissertation |c Lancaster University, Lancashire, England | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Nanoscale science | |
| 650 | 4 | |a Nanoscience | |
| 650 | 4 | |a Nanostructures | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Interfaces (Physical sciences) | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Nanoscale Science and Technology | |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
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Datensatz im Suchindex
| _version_ | 1804178098034311168 |
|---|---|
| any_adam_object | |
| author | Kay, Nicholas D. |
| author_facet | Kay, Nicholas D. |
| author_role | aut |
| author_sort | Kay, Nicholas D. |
| author_variant | n d k nd ndk |
| building | Verbundindex |
| bvnumber | BV044660778 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (ZDB-2-PHA)9783319701813 (OCoLC)1014081264 (DE-599)BVBBV044660778 |
| dewey-full | 530.417 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.417 |
| dewey-search | 530.417 |
| dewey-sort | 3530.417 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-319-70181-3 |
| format | Thesis Electronic eBook |
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| genre_facet | Hochschulschrift |
| id | DE-604.BV044660778 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:58:34Z |
| institution | BVB |
| isbn | 9783319701813 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030058281 |
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| physical | 1 Online-Ressource (XXI, 122 p. 67 illus., 14 illus. in color) |
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| publishDate | 2018 |
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| publisher | Springer |
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| series2 | Springer Theses, Recognizing Outstanding Ph.D. Research |
| spelling | Kay, Nicholas D. Verfasser aut Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach Nicholas D. Kay Cham Springer [2018] 1 Online-Ressource (XXI, 122 p. 67 illus., 14 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Theses, Recognizing Outstanding Ph.D. Research Dissertation Lancaster University, Lancashire, England Physics Nanoscale science Nanoscience Nanostructures Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Nanotechnology Surface and Interface Science, Thin Films Spectroscopy and Microscopy Nanoscale Science and Technology (DE-588)4113937-9 Hochschulschrift gnd-content Erscheint auch als Druck-Ausgabe 978-3-319-70180-6 https://doi.org/10.1007/978-3-319-70181-3 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Kay, Nicholas D. Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach Physics Nanoscale science Nanoscience Nanostructures Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Nanotechnology Surface and Interface Science, Thin Films Spectroscopy and Microscopy Nanoscale Science and Technology |
| subject_GND | (DE-588)4113937-9 |
| title | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach |
| title_auth | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach |
| title_exact_search | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach |
| title_full | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach Nicholas D. Kay |
| title_fullStr | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach Nicholas D. Kay |
| title_full_unstemmed | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals a Scanning Probe Microscopy Approach Nicholas D. Kay |
| title_short | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals |
| title_sort | nanomechanical and nanoelectromechanical phenomena in 2d atomic crystals a scanning probe microscopy approach |
| title_sub | a Scanning Probe Microscopy Approach |
| topic | Physics Nanoscale science Nanoscience Nanostructures Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Nanotechnology Surface and Interface Science, Thin Films Spectroscopy and Microscopy Nanoscale Science and Technology |
| topic_facet | Physics Nanoscale science Nanoscience Nanostructures Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Nanotechnology Surface and Interface Science, Thin Films Spectroscopy and Microscopy Nanoscale Science and Technology Hochschulschrift |
| url | https://doi.org/10.1007/978-3-319-70181-3 |
| work_keys_str_mv | AT kaynicholasd nanomechanicalandnanoelectromechanicalphenomenain2datomiccrystalsascanningprobemicroscopyapproach |