Conductive atomic force microscopy: applications in nanomaterials
Gespeichert in:
Weitere Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Chichester, West Sussex
Wiley
[2017]
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Schlagworte: | |
Online-Zugang: | FRO01 UBG01 Volltext |
Beschreibung: | 1 Online-Ressource (250 p.) |
ISBN: | 9783527699773 9783527699780 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author2 | Lanza, Mario |
author2_role | edt |
author2_variant | m l ml |
author_facet | Lanza, Mario |
building | Verbundindex |
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dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620/.5 |
dewey-search | 620/.5 |
dewey-sort | 3620 15 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
format | Electronic eBook |
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spelling | Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza Chichester, West Sussex Wiley [2017] 1 Online-Ressource (250 p.) txt rdacontent c rdamedia cr rdacarrier Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit (DE-588)4014200-0 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Elektrische Leitfähigkeit (DE-588)4014200-0 s Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Lanza, Mario edt Erscheint auch als Druck-Ausgabe 9783527340910 https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Conductive atomic force microscopy applications in nanomaterials Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit (DE-588)4014200-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
subject_GND | (DE-588)4014200-0 (DE-588)4274473-8 (DE-588)4143413-4 |
title | Conductive atomic force microscopy applications in nanomaterials |
title_auth | Conductive atomic force microscopy applications in nanomaterials |
title_exact_search | Conductive atomic force microscopy applications in nanomaterials |
title_full | Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza |
title_fullStr | Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza |
title_full_unstemmed | Conductive atomic force microscopy applications in nanomaterials edited by Mario Lanza |
title_short | Conductive atomic force microscopy |
title_sort | conductive atomic force microscopy applications in nanomaterials |
title_sub | applications in nanomaterials |
topic | Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit (DE-588)4014200-0 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
topic_facet | Atomic force microscopy / fast / (OCoLC)fst00820609 Atomic force microscopy Elektrische Leitfähigkeit Rasterkraftmikroskopie Aufsatzsammlung |
url | https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699773 |
work_keys_str_mv | AT lanzamario conductiveatomicforcemicroscopyapplicationsinnanomaterials |