Advanced mathematical & computational tools in metrology & testing VIII:
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review v...
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
World Scientific
c2009
|
| Schriftenreihe: | Series on advances in mathematics for applied sciences
v. 78 |
| Schlagworte: | |
| Online-Zugang: | FHN01 Volltext |
| Zusammenfassung: | The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), data fusion techniques and design and analysis of inter-laboratory comparisons |
| Beschreibung: | xii, 406 p. ill. (some col.) |
| ISBN: | 9789812839527 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044637213 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 171120s2009 |||| o||u| ||||||eng d | ||
| 020 | |a 9789812839527 |c electronic bk. |9 978-981-283-952-7 | ||
| 024 | 7 | |a 10.1142/7212 |2 doi | |
| 035 | |a (ZDB-124-WOP)00002114 | ||
| 035 | |a (OCoLC)1012669434 | ||
| 035 | |a (DE-599)BVBBV044637213 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-92 | ||
| 082 | 0 | |a 530.8 |2 22 | |
| 110 | 2 | |a AMCTM VIII <2008, Paris, France> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced mathematical & computational tools in metrology & testing VIII |c editors, F. Pavese ... [et al.] |
| 246 | 1 | 3 | |a Advanced mathematical and computational tools in metrology and testing VIII |
| 246 | 1 | 3 | |a AMCTM 8 |
| 264 | 1 | |a Singapore |b World Scientific |c c2009 | |
| 300 | |a xii, 406 p. |b ill. (some col.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Series on advances in mathematics for applied sciences |v v. 78 | |
| 520 | |a The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), data fusion techniques and design and analysis of inter-laboratory comparisons | ||
| 650 | 4 | |a Measurement / Congresses | |
| 650 | 4 | |a Physical measurements / Congresses | |
| 650 | 4 | |a Metrology / Congresses | |
| 655 | 7 | |8 1\p |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Pavese, Franco |e Sonstige |4 oth | |
| 710 | 2 | |a World Scientific (Firm) |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9789812839510 (hbk.) |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9812839518 (hbk.) |
| 856 | 4 | 0 | |u http://www.worldscientific.com/worldscibooks/10.1142/7212#t=toc |x Verlag |z URL des Erstveroeffentlichers |3 Volltext |
| 912 | |a ZDB-124-WOP | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030035184 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://www.worldscientific.com/worldscibooks/10.1142/7212#t=toc |l FHN01 |p ZDB-124-WOP |q FHN_PDA_WOP |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804178052546035712 |
|---|---|
| any_adam_object | |
| author_corporate | AMCTM VIII <2008, Paris, France> |
| author_corporate_role | aut |
| author_facet | AMCTM VIII <2008, Paris, France> |
| author_sort | AMCTM VIII <2008, Paris, France> |
| building | Verbundindex |
| bvnumber | BV044637213 |
| collection | ZDB-124-WOP |
| ctrlnum | (ZDB-124-WOP)00002114 (OCoLC)1012669434 (DE-599)BVBBV044637213 |
| dewey-full | 530.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.8 |
| dewey-search | 530.8 |
| dewey-sort | 3530.8 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03056nmm a2200481zcb4500</leader><controlfield tag="001">BV044637213</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">171120s2009 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812839527</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-981-283-952-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1142/7212</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-124-WOP)00002114 </subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1012669434</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044637213</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.8</subfield><subfield code="2">22</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">AMCTM VIII <2008, Paris, France></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced mathematical & computational tools in metrology & testing VIII</subfield><subfield code="c">editors, F. Pavese ... [et al.]</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Advanced mathematical and computational tools in metrology and testing VIII</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">AMCTM 8</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific</subfield><subfield code="c">c2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xii, 406 p.</subfield><subfield code="b">ill. (some col.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Series on advances in mathematics for applied sciences</subfield><subfield code="v">v. 78</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), data fusion techniques and design and analysis of inter-laboratory comparisons</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement / Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical measurements / Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metrology / Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pavese, Franco</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">World Scientific (Firm)</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9789812839510 (hbk.)</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9812839518 (hbk.)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.worldscientific.com/worldscibooks/10.1142/7212#t=toc</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveroeffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-124-WOP</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030035184</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.worldscientific.com/worldscibooks/10.1142/7212#t=toc</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-124-WOP</subfield><subfield code="q">FHN_PDA_WOP</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044637213 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:57:50Z |
| institution | BVB |
| isbn | 9789812839527 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030035184 |
| oclc_num | 1012669434 |
| open_access_boolean | |
| owner | DE-92 |
| owner_facet | DE-92 |
| physical | xii, 406 p. ill. (some col.) |
| psigel | ZDB-124-WOP ZDB-124-WOP FHN_PDA_WOP |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | World Scientific |
| record_format | marc |
| series2 | Series on advances in mathematics for applied sciences |
| spelling | AMCTM VIII <2008, Paris, France> Verfasser aut Advanced mathematical & computational tools in metrology & testing VIII editors, F. Pavese ... [et al.] Advanced mathematical and computational tools in metrology and testing VIII AMCTM 8 Singapore World Scientific c2009 xii, 406 p. ill. (some col.) txt rdacontent c rdamedia cr rdacarrier Series on advances in mathematics for applied sciences v. 78 The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), data fusion techniques and design and analysis of inter-laboratory comparisons Measurement / Congresses Physical measurements / Congresses Metrology / Congresses 1\p (DE-588)1071861417 Konferenzschrift gnd-content Pavese, Franco Sonstige oth World Scientific (Firm) Sonstige oth Erscheint auch als Druck-Ausgabe 9789812839510 (hbk.) Erscheint auch als Druck-Ausgabe 9812839518 (hbk.) http://www.worldscientific.com/worldscibooks/10.1142/7212#t=toc Verlag URL des Erstveroeffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Advanced mathematical & computational tools in metrology & testing VIII Measurement / Congresses Physical measurements / Congresses Metrology / Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Advanced mathematical & computational tools in metrology & testing VIII |
| title_alt | Advanced mathematical and computational tools in metrology and testing VIII AMCTM 8 |
| title_auth | Advanced mathematical & computational tools in metrology & testing VIII |
| title_exact_search | Advanced mathematical & computational tools in metrology & testing VIII |
| title_full | Advanced mathematical & computational tools in metrology & testing VIII editors, F. Pavese ... [et al.] |
| title_fullStr | Advanced mathematical & computational tools in metrology & testing VIII editors, F. Pavese ... [et al.] |
| title_full_unstemmed | Advanced mathematical & computational tools in metrology & testing VIII editors, F. Pavese ... [et al.] |
| title_short | Advanced mathematical & computational tools in metrology & testing VIII |
| title_sort | advanced mathematical computational tools in metrology testing viii |
| topic | Measurement / Congresses Physical measurements / Congresses Metrology / Congresses |
| topic_facet | Measurement / Congresses Physical measurements / Congresses Metrology / Congresses Konferenzschrift |
| url | http://www.worldscientific.com/worldscibooks/10.1142/7212#t=toc |
| work_keys_str_mv | AT amctmviii2008parisfrance advancedmathematicalcomputationaltoolsinmetrologytestingviii AT pavesefranco advancedmathematicalcomputationaltoolsinmetrologytestingviii AT worldscientificfirm advancedmathematicalcomputationaltoolsinmetrologytestingviii AT amctmviii2008parisfrance advancedmathematicalandcomputationaltoolsinmetrologyandtestingviii AT pavesefranco advancedmathematicalandcomputationaltoolsinmetrologyandtestingviii AT worldscientificfirm advancedmathematicalandcomputationaltoolsinmetrologyandtestingviii AT amctmviii2008parisfrance amctm8 AT pavesefranco amctm8 AT worldscientificfirm amctm8 |