Scanning electron microscope optics and spectrometers:
This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning ele...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai
World Scientific
[2011]
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| Schlagworte: | |
| Online-Zugang: | FHN01 Volltext |
| Zusammenfassung: | This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign |
| Beschreibung: | xiii, 402 Seiten Illustrationen, Diagramme |
| ISBN: | 9789812836687 9789814469357 |
Internformat
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| 245 | 1 | 0 | |a Scanning electron microscope optics and spectrometers |c Anjam Khursheed, National University of Singapore, Singapore |
| 264 | 1 | |a New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai |b World Scientific |c [2011] | |
| 264 | 4 | |c © 2011 | |
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| 520 | |a This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign | ||
| 650 | 4 | |a Scanning electron microscopes / Design and construction | |
| 650 | 4 | |a Spectrometer / Design and construction | |
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Datensatz im Suchindex
| _version_ | 1804178052473683969 |
|---|---|
| any_adam_object | |
| author | Khursheed, Anjam |
| author_facet | Khursheed, Anjam |
| author_role | aut |
| author_sort | Khursheed, Anjam |
| author_variant | a k ak |
| building | Verbundindex |
| bvnumber | BV044637121 |
| collection | ZDB-124-WOP |
| ctrlnum | (ZDB-124-WOP)00001205 (OCoLC)934986250 (DE-599)BVBBV044637121 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
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| id | DE-604.BV044637121 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:57:50Z |
| institution | BVB |
| isbn | 9789812836687 9789814469357 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030035093 |
| oclc_num | 934986250 |
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| owner_facet | DE-92 DE-11 |
| physical | xiii, 402 Seiten Illustrationen, Diagramme |
| psigel | ZDB-124-WOP ZDB-124-WOP FHN_PDA_WOP |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Khursheed, Anjam Verfasser aut Scanning electron microscope optics and spectrometers Anjam Khursheed, National University of Singapore, Singapore New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai World Scientific [2011] © 2011 xiii, 402 Seiten Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign Scanning electron microscopes / Design and construction Spectrometer / Design and construction Rasterelektronenmikroskop (DE-588)4124024-8 gnd rswk-swf Rasterelektronenmikroskop (DE-588)4124024-8 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 978-981-283-667-0 Erscheint auch als Druck-Ausgabe 981-283-667-5 http://www.worldscientific.com/worldscibooks/10.1142/7094#t=toc Verlag URL des Erstveroeffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Khursheed, Anjam Scanning electron microscope optics and spectrometers Scanning electron microscopes / Design and construction Spectrometer / Design and construction Rasterelektronenmikroskop (DE-588)4124024-8 gnd |
| subject_GND | (DE-588)4124024-8 |
| title | Scanning electron microscope optics and spectrometers |
| title_auth | Scanning electron microscope optics and spectrometers |
| title_exact_search | Scanning electron microscope optics and spectrometers |
| title_full | Scanning electron microscope optics and spectrometers Anjam Khursheed, National University of Singapore, Singapore |
| title_fullStr | Scanning electron microscope optics and spectrometers Anjam Khursheed, National University of Singapore, Singapore |
| title_full_unstemmed | Scanning electron microscope optics and spectrometers Anjam Khursheed, National University of Singapore, Singapore |
| title_short | Scanning electron microscope optics and spectrometers |
| title_sort | scanning electron microscope optics and spectrometers |
| topic | Scanning electron microscopes / Design and construction Spectrometer / Design and construction Rasterelektronenmikroskop (DE-588)4124024-8 gnd |
| topic_facet | Scanning electron microscopes / Design and construction Spectrometer / Design and construction Rasterelektronenmikroskop |
| url | http://www.worldscientific.com/worldscibooks/10.1142/7094#t=toc |
| work_keys_str_mv | AT khursheedanjam scanningelectronmicroscopeopticsandspectrometers |