Frontiers in reliability: a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability
This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability,...
Gespeichert in:
Format: | Elektronisch E-Book |
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Sprache: | English |
Veröffentlicht: |
Singapore
World Scientific Pub. Co.
c1998
|
Schriftenreihe: | Series on quality, reliability, and engineering statistics
vol. 4) |
Schlagworte: | |
Online-Zugang: | FHN01 URL des Erstveroeffentlichers |
Zusammenfassung: | This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform |
Beschreibung: | xi, 435 p. ill |
ISBN: | 9789812816580 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV044636560 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 171120s1998 |||| o||u| ||||||eng d | ||
020 | |a 9789812816580 |9 978-981-281-658-0 | ||
024 | 7 | |a 10.1142/3686 |2 doi | |
035 | |a (ZDB-124-WOP)00004607 | ||
035 | |a (OCoLC)1012663200 | ||
035 | |a (DE-599)BVBBV044636560 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-92 | ||
082 | 0 | |a 620/.00452/015195 |2 22 | |
084 | |a ZG 9270 |0 (DE-625)156055: |2 rvk | ||
245 | 1 | 0 | |a Frontiers in reliability |b a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability |c editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay. ShyamaprasadMukhopadhyay, Sujit K. Basu |
264 | 1 | |a Singapore |b World Scientific Pub. Co. |c c1998 | |
300 | |a xi, 435 p. |b ill | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Series on quality, reliability, and engineering statistics |v vol. 4) | |
520 | |a This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform | ||
650 | 4 | |a Reliability (Engineering) | |
650 | 4 | |a Reliability (Engineering) / Statistical methods | |
650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
655 | 7 | |8 1\p |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
689 | 0 | 0 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
689 | 0 | |8 2\p |5 DE-604 | |
700 | 1 | |a Basu, Asit P. |e Sonstige |4 oth | |
700 | 0 | |a Mukhopadhyay,Shyamaprasad |e Sonstige |4 oth | |
700 | 1 | |a Basu, Sujit K. |e Sonstige |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9789810233600 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9810233604 |
856 | 4 | 0 | |u http://www.worldscientific.com/worldscibooks/10.1142/3686#t=toc |x Verlag |z URL des Erstveroeffentlichers |3 Volltext |
912 | |a ZDB-124-WOP | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-030034533 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
966 | e | |u http://www.worldscientific.com/worldscibooks/10.1142/3686#t=toc |l FHN01 |p ZDB-124-WOP |q FHN_PDA_WOP |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804178051044474880 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV044636560 |
classification_rvk | ZG 9270 |
collection | ZDB-124-WOP |
ctrlnum | (ZDB-124-WOP)00004607 (OCoLC)1012663200 (DE-599)BVBBV044636560 |
dewey-full | 620/.00452/015195 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620/.00452/015195 |
dewey-search | 620/.00452/015195 |
dewey-sort | 3620 3452 515195 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Technik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03078nmm a2200505zcb4500</leader><controlfield tag="001">BV044636560</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">171120s1998 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812816580</subfield><subfield code="9">978-981-281-658-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1142/3686</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-124-WOP)00004607</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1012663200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044636560</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620/.00452/015195</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZG 9270</subfield><subfield code="0">(DE-625)156055:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Frontiers in reliability</subfield><subfield code="b">a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability</subfield><subfield code="c">editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay. ShyamaprasadMukhopadhyay, Sujit K. Basu</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific Pub. Co.</subfield><subfield code="c">c1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xi, 435 p.</subfield><subfield code="b">ill</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Series on quality, reliability, and engineering statistics</subfield><subfield code="v">vol. 4)</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability (Engineering)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability (Engineering) / Statistical methods</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Basu, Asit P.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="0" ind2=" "><subfield code="a">Mukhopadhyay,Shyamaprasad</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Basu, Sujit K.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9789810233600</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9810233604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.worldscientific.com/worldscibooks/10.1142/3686#t=toc</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveroeffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-124-WOP</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030034533</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.worldscientific.com/worldscibooks/10.1142/3686#t=toc</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-124-WOP</subfield><subfield code="q">FHN_PDA_WOP</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
genre | 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content |
genre_facet | Aufsatzsammlung |
id | DE-604.BV044636560 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:57:49Z |
institution | BVB |
isbn | 9789812816580 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030034533 |
oclc_num | 1012663200 |
open_access_boolean | |
owner | DE-92 |
owner_facet | DE-92 |
physical | xi, 435 p. ill |
psigel | ZDB-124-WOP ZDB-124-WOP FHN_PDA_WOP |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | World Scientific Pub. Co. |
record_format | marc |
series2 | Series on quality, reliability, and engineering statistics |
spelling | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay. ShyamaprasadMukhopadhyay, Sujit K. Basu Singapore World Scientific Pub. Co. c1998 xi, 435 p. ill txt rdacontent c rdamedia cr rdacarrier Series on quality, reliability, and engineering statistics vol. 4) This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform Reliability (Engineering) Reliability (Engineering) / Statistical methods Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content Zuverlässigkeit (DE-588)4059245-5 s 2\p DE-604 Basu, Asit P. Sonstige oth Mukhopadhyay,Shyamaprasad Sonstige oth Basu, Sujit K. Sonstige oth Erscheint auch als Druck-Ausgabe 9789810233600 Erscheint auch als Druck-Ausgabe 9810233604 http://www.worldscientific.com/worldscibooks/10.1142/3686#t=toc Verlag URL des Erstveroeffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability Reliability (Engineering) Reliability (Engineering) / Statistical methods Zuverlässigkeit (DE-588)4059245-5 gnd |
subject_GND | (DE-588)4059245-5 (DE-588)4143413-4 |
title | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability |
title_auth | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability |
title_exact_search | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability |
title_full | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay. ShyamaprasadMukhopadhyay, Sujit K. Basu |
title_fullStr | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay. ShyamaprasadMukhopadhyay, Sujit K. Basu |
title_full_unstemmed | Frontiers in reliability a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay. ShyamaprasadMukhopadhyay, Sujit K. Basu |
title_short | Frontiers in reliability |
title_sort | frontiers in reliability a volume commemorating the first 25 years of the indian association for productivity quality and reliability |
title_sub | a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability |
topic | Reliability (Engineering) Reliability (Engineering) / Statistical methods Zuverlässigkeit (DE-588)4059245-5 gnd |
topic_facet | Reliability (Engineering) Reliability (Engineering) / Statistical methods Zuverlässigkeit Aufsatzsammlung |
url | http://www.worldscientific.com/worldscibooks/10.1142/3686#t=toc |
work_keys_str_mv | AT basuasitp frontiersinreliabilityavolumecommemoratingthefirst25yearsoftheindianassociationforproductivityqualityandreliability AT mukhopadhyayshyamaprasad frontiersinreliabilityavolumecommemoratingthefirst25yearsoftheindianassociationforproductivityqualityandreliability AT basusujitk frontiersinreliabilityavolumecommemoratingthefirst25yearsoftheindianassociationforproductivityqualityandreliability |