X-ray scattering from semiconductors:
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
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| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
London
Imperial College Press
c2003
|
| Edition: | 2nd ed |
| Subjects: | |
| Online Access: | FHN01 Volltext |
| Summary: | This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented |
| Physical Description: | xiv, 299 p. ill |
| ISBN: | 9781860944581 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044633570 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 171120s2003 |||| o||u| ||||||eng d | ||
| 020 | |a 9781860944581 |c electronic bk. |9 978-1-86094-458-1 | ||
| 024 | 7 | |a 10.1142/P289 |2 doi | |
| 035 | |a (ZDB-124-WOP)00003500 | ||
| 035 | |a (OCoLC)1012648830 | ||
| 035 | |a (DE-599)BVBBV044633570 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-92 | ||
| 082 | 0 | |a 539.7222 |2 22 | |
| 100 | 1 | |a Fewster, Paul F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a X-ray scattering from semiconductors |c Paul F Fewster |
| 250 | |a 2nd ed | ||
| 264 | 1 | |a London |b Imperial College Press |c c2003 | |
| 300 | |a xiv, 299 p. |b ill | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 520 | |a This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented | ||
| 650 | 4 | |a X-rays / Scattering | |
| 650 | 4 | |a Semiconductors | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstreuung |0 (DE-588)4178324-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Röntgenstreuung |0 (DE-588)4178324-4 |D s |
| 689 | 0 | 1 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 1860943608 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781860943607 |
| 856 | 4 | 0 | |u http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc |x Verlag |z URL des Erstveroeffentlichers |3 Volltext |
| 912 | |a ZDB-124-WOP | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030031542 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc |l FHN01 |p ZDB-124-WOP |q FHN_PDA_WOP |x Verlag |3 Volltext | |
Record in the Search Index
| _version_ | 1804178044266479616 |
|---|---|
| any_adam_object | |
| author | Fewster, Paul F. |
| author_facet | Fewster, Paul F. |
| author_role | aut |
| author_sort | Fewster, Paul F. |
| author_variant | p f f pf pff |
| building | Verbundindex |
| bvnumber | BV044633570 |
| collection | ZDB-124-WOP |
| ctrlnum | (ZDB-124-WOP)00003500 (OCoLC)1012648830 (DE-599)BVBBV044633570 |
| dewey-full | 539.7222 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
| dewey-raw | 539.7222 |
| dewey-search | 539.7222 |
| dewey-sort | 3539.7222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 2nd ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02962nmm a2200469zc 4500</leader><controlfield tag="001">BV044633570</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">171120s2003 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781860944581</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-1-86094-458-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1142/P289</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-124-WOP)00003500</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1012648830</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044633570</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">539.7222</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Fewster, Paul F.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-ray scattering from semiconductors</subfield><subfield code="c">Paul F Fewster</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2nd ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London</subfield><subfield code="b">Imperial College Press</subfield><subfield code="c">c2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiv, 299 p.</subfield><subfield code="b">ill</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-rays / Scattering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstreuung</subfield><subfield code="0">(DE-588)4178324-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Röntgenstreuung</subfield><subfield code="0">(DE-588)4178324-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">1860943608</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781860943607</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveroeffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-124-WOP</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030031542</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-124-WOP</subfield><subfield code="q">FHN_PDA_WOP</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044633570 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:57:42Z |
| institution | BVB |
| isbn | 9781860944581 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030031542 |
| oclc_num | 1012648830 |
| open_access_boolean | |
| owner | DE-92 |
| owner_facet | DE-92 |
| physical | xiv, 299 p. ill |
| psigel | ZDB-124-WOP ZDB-124-WOP FHN_PDA_WOP |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Imperial College Press |
| record_format | marc |
| spelling | Fewster, Paul F. Verfasser aut X-ray scattering from semiconductors Paul F Fewster 2nd ed London Imperial College Press c2003 xiv, 299 p. ill txt rdacontent c rdamedia cr rdacarrier This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented X-rays / Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s Halbleiter (DE-588)4022993-2 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 1860943608 Erscheint auch als Druck-Ausgabe 9781860943607 http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc Verlag URL des Erstveroeffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fewster, Paul F. X-ray scattering from semiconductors X-rays / Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4178324-4 |
| title | X-ray scattering from semiconductors |
| title_auth | X-ray scattering from semiconductors |
| title_exact_search | X-ray scattering from semiconductors |
| title_full | X-ray scattering from semiconductors Paul F Fewster |
| title_fullStr | X-ray scattering from semiconductors Paul F Fewster |
| title_full_unstemmed | X-ray scattering from semiconductors Paul F Fewster |
| title_short | X-ray scattering from semiconductors |
| title_sort | x ray scattering from semiconductors |
| topic | X-rays / Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| topic_facet | X-rays / Scattering Semiconductors Halbleiter Röntgenstreuung |
| url | http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc |
| work_keys_str_mv | AT fewsterpaulf xrayscatteringfromsemiconductors |