X-ray scattering from semiconductors:
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
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| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Imperial College Press
c2003
|
| Ausgabe: | 2nd ed |
| Schlagworte: | |
| Online-Zugang: | FHN01 Volltext |
| Zusammenfassung: | This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented |
| Beschreibung: | xiv, 299 p. ill |
| ISBN: | 9781860944581 |
Internformat
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| 520 | |a This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented | ||
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Datensatz im Suchindex
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| author | Fewster, Paul F. |
| author_facet | Fewster, Paul F. |
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| author_sort | Fewster, Paul F. |
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| bvnumber | BV044633570 |
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| dewey-full | 539.7222 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
| dewey-raw | 539.7222 |
| dewey-search | 539.7222 |
| dewey-sort | 3539.7222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 2nd ed |
| format | Electronic eBook |
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| id | DE-604.BV044633570 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:57:42Z |
| institution | BVB |
| isbn | 9781860944581 |
| language | English |
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| physical | xiv, 299 p. ill |
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| publishDate | 2003 |
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| publishDateSort | 2003 |
| publisher | Imperial College Press |
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| spelling | Fewster, Paul F. Verfasser aut X-ray scattering from semiconductors Paul F Fewster 2nd ed London Imperial College Press c2003 xiv, 299 p. ill txt rdacontent c rdamedia cr rdacarrier This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces. A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented X-rays / Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s Halbleiter (DE-588)4022993-2 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 1860943608 Erscheint auch als Druck-Ausgabe 9781860943607 http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc Verlag URL des Erstveroeffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fewster, Paul F. X-ray scattering from semiconductors X-rays / Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4178324-4 |
| title | X-ray scattering from semiconductors |
| title_auth | X-ray scattering from semiconductors |
| title_exact_search | X-ray scattering from semiconductors |
| title_full | X-ray scattering from semiconductors Paul F Fewster |
| title_fullStr | X-ray scattering from semiconductors Paul F Fewster |
| title_full_unstemmed | X-ray scattering from semiconductors Paul F Fewster |
| title_short | X-ray scattering from semiconductors |
| title_sort | x ray scattering from semiconductors |
| topic | X-rays / Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| topic_facet | X-rays / Scattering Semiconductors Halbleiter Röntgenstreuung |
| url | http://www.worldscientific.com/worldscibooks/10.1142/P289#t=toc |
| work_keys_str_mv | AT fewsterpaulf xrayscatteringfromsemiconductors |