Scanning transmission electron microscopy of nanomaterials: basics of imaging and analysis

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologi...

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Bibliographische Detailangaben
Weitere Verfasser: Tanaka, Nobuo 1949- (HerausgeberIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: London Imperial College Press [2015]
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Online-Zugang:FHN01
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Zusammenfassung:The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials
Beschreibung:1 Online-Ressource (xxxix, 571 S.) Illustrationen
ISBN:9781848167902
DOI:10.1142/P807

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