X-ray scattering from semiconductors:
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have bee...
Gespeichert in:
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Imperial College Press
c2000
|
| Schlagworte: | |
| Online-Zugang: | FHN01 Volltext |
| Zusammenfassung: | X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors |
| Beschreibung: | 287 p. ill |
| ISBN: | 9781848160477 |
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| 520 | |a X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors | ||
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Datensatz im Suchindex
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| author | Fewster, Paul F. |
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| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
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| id | DE-604.BV044633257 |
| illustrated | Not Illustrated |
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| isbn | 9781848160477 |
| language | English |
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| spelling | Fewster, Paul F. Verfasser aut X-ray scattering from semiconductors Paul F Fewster London Imperial College Press c2000 287 p. ill txt rdacontent c rdamedia cr rdacarrier X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors Semiconductors X-rays / Scattering Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s Halbleiter (DE-588)4022993-2 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 1860941591 Erscheint auch als Druck-Ausgabe 9781860941597 http://www.worldscientific.com/worldscibooks/10.1142/P137#t=toc Verlag URL des Erstveroeffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fewster, Paul F. X-ray scattering from semiconductors Semiconductors X-rays / Scattering Röntgenstreuung (DE-588)4178324-4 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4178324-4 (DE-588)4022993-2 |
| title | X-ray scattering from semiconductors |
| title_auth | X-ray scattering from semiconductors |
| title_exact_search | X-ray scattering from semiconductors |
| title_full | X-ray scattering from semiconductors Paul F Fewster |
| title_fullStr | X-ray scattering from semiconductors Paul F Fewster |
| title_full_unstemmed | X-ray scattering from semiconductors Paul F Fewster |
| title_short | X-ray scattering from semiconductors |
| title_sort | x ray scattering from semiconductors |
| topic | Semiconductors X-rays / Scattering Röntgenstreuung (DE-588)4178324-4 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Semiconductors X-rays / Scattering Röntgenstreuung Halbleiter |
| url | http://www.worldscientific.com/worldscibooks/10.1142/P137#t=toc |
| work_keys_str_mv | AT fewsterpaulf xrayscatteringfromsemiconductors |