Measurement techniques for radio frequency nanoelectronics:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, United Kingdom ; New York, NY, USA
Cambridge University Press
2017
|
| Schriftenreihe: | The Cambridge RF and microwave engineering series
|
| Schlagworte: | |
| Beschreibung: | xiv, 314 Seiten Illustrationen, Diagramme |
| ISBN: | 9781107120686 1107120683 |
Internformat
MARC
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| 020 | |a 9781107120686 |9 978-1-107-12068-6 | ||
| 020 | |a 1107120683 |9 1-107-12068-3 | ||
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| 100 | 1 | |a Wallis, T. Mitch |d 1974- |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Measurement techniques for radio frequency nanoelectronics |c T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| 264 | 1 | |a Cambridge, United Kingdom ; New York, NY, USA |b Cambridge University Press |c 2017 | |
| 300 | |a xiv, 314 Seiten |b Illustrationen, Diagramme | ||
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| 653 | 0 | |a Radio frequency / Measurement | |
| 653 | 0 | |a Nanoelectronics | |
| 653 | 0 | |a Radio frequency microelectromechanical systems | |
| 689 | 0 | 0 | |a Nanoelektronik |0 (DE-588)4732034-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Kaboš, Pavel |e Sonstige |4 oth | |
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| id | DE-604.BV044551905 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:55:41Z |
| institution | BVB |
| isbn | 9781107120686 1107120683 |
| language | English |
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| physical | xiv, 314 Seiten Illustrationen, Diagramme |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Cambridge University Press |
| record_format | marc |
| series2 | The Cambridge RF and microwave engineering series |
| spelling | Wallis, T. Mitch 1974- Verfasser aut Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder Cambridge, United Kingdom ; New York, NY, USA Cambridge University Press 2017 xiv, 314 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier The Cambridge RF and microwave engineering series Nanoelektronik (DE-588)4732034-5 gnd rswk-swf Radio frequency / Measurement Nanoelectronics Radio frequency microelectromechanical systems Nanoelektronik (DE-588)4732034-5 s DE-604 Kaboš, Pavel Sonstige oth |
| spellingShingle | Wallis, T. Mitch 1974- Measurement techniques for radio frequency nanoelectronics Nanoelektronik (DE-588)4732034-5 gnd |
| subject_GND | (DE-588)4732034-5 |
| title | Measurement techniques for radio frequency nanoelectronics |
| title_auth | Measurement techniques for radio frequency nanoelectronics |
| title_exact_search | Measurement techniques for radio frequency nanoelectronics |
| title_full | Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| title_fullStr | Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| title_full_unstemmed | Measurement techniques for radio frequency nanoelectronics T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder |
| title_short | Measurement techniques for radio frequency nanoelectronics |
| title_sort | measurement techniques for radio frequency nanoelectronics |
| topic | Nanoelektronik (DE-588)4732034-5 gnd |
| topic_facet | Nanoelektronik |
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