Software Failure Investigation: A Near-Miss Analysis Approach
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Bibliographic Details
Main Author: Eloff, Jan (Author)
Format: Electronic eBook
Language:English
Published: Cham Springer International Publishing 2018
Subjects:
Online Access:BTU01
FAW01
FHA01
FHI01
FHM01
FHN01
FHR01
FKE01
FLA01
FRO01
FWS01
FWS02
HTW01
TUM01
UBY01
Volltext
Physical Description:1 Online-Ressource (IX, 119 p. 83 illus., 21 illus. in color)
ISBN:9783319613345
DOI:10.1007/978-3-319-61334-5