Software Failure Investigation: A Near-Miss Analysis Approach
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Cham
Springer International Publishing
2018
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Schlagworte: | |
Online-Zugang: | BTU01 FAW01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 Volltext |
Beschreibung: | 1 Online-Ressource (IX, 119 p. 83 illus., 21 illus. in color) |
ISBN: | 9783319613345 |
DOI: | 10.1007/978-3-319-61334-5 |
Internformat
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Datensatz im Suchindex
DE-BY-FWS_katkey | 677219 |
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any_adam_object | |
author | Eloff, Jan |
author_facet | Eloff, Jan |
author_role | aut |
author_sort | Eloff, Jan |
author_variant | j e je |
building | Verbundindex |
bvnumber | BV044531085 |
classification_tum | ELT 000 MAS 000 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)9783319613345 (OCoLC)1011365363 (DE-599)BVBBV044531085 |
dewey-full | 621.382 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.382 |
dewey-search | 621.382 |
dewey-sort | 3621.382 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
doi_str_mv | 10.1007/978-3-319-61334-5 |
format | Electronic eBook |
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id | DE-604.BV044531085 |
illustrated | Not Illustrated |
indexdate | 2024-08-01T13:01:37Z |
institution | BVB |
isbn | 9783319613345 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029930375 |
oclc_num | 1011365363 |
open_access_boolean | |
owner | DE-861 DE-1046 DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-Aug4 DE-862 DE-BY-FWS DE-863 DE-BY-FWS DE-634 DE-523 DE-706 DE-91 DE-BY-TUM DE-860 DE-573 |
owner_facet | DE-861 DE-1046 DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-Aug4 DE-862 DE-BY-FWS DE-863 DE-BY-FWS DE-634 DE-523 DE-706 DE-91 DE-BY-TUM DE-860 DE-573 |
physical | 1 Online-Ressource (IX, 119 p. 83 illus., 21 illus. in color) |
psigel | ZDB-2-ENG ZDB-2-ENG_2018 |
publishDate | 2018 |
publishDateSearch | 2018 |
publishDateSort | 2018 |
publisher | Springer International Publishing |
record_format | marc |
spellingShingle | Eloff, Jan Software Failure Investigation A Near-Miss Analysis Approach Engineering Computer communication systems Software engineering Computers Quality control Reliability Industrial safety Electrical engineering Communications Engineering, Networks Quality Control, Reliability, Safety and Risk Software Engineering Information Systems and Communication Service Computer Communication Networks Ingenieurwissenschaften |
title | Software Failure Investigation A Near-Miss Analysis Approach |
title_auth | Software Failure Investigation A Near-Miss Analysis Approach |
title_exact_search | Software Failure Investigation A Near-Miss Analysis Approach |
title_full | Software Failure Investigation A Near-Miss Analysis Approach by Jan Eloff, Madeleine Bihina Bella |
title_fullStr | Software Failure Investigation A Near-Miss Analysis Approach by Jan Eloff, Madeleine Bihina Bella |
title_full_unstemmed | Software Failure Investigation A Near-Miss Analysis Approach by Jan Eloff, Madeleine Bihina Bella |
title_short | Software Failure Investigation |
title_sort | software failure investigation a near miss analysis approach |
title_sub | A Near-Miss Analysis Approach |
topic | Engineering Computer communication systems Software engineering Computers Quality control Reliability Industrial safety Electrical engineering Communications Engineering, Networks Quality Control, Reliability, Safety and Risk Software Engineering Information Systems and Communication Service Computer Communication Networks Ingenieurwissenschaften |
topic_facet | Engineering Computer communication systems Software engineering Computers Quality control Reliability Industrial safety Electrical engineering Communications Engineering, Networks Quality Control, Reliability, Safety and Risk Software Engineering Information Systems and Communication Service Computer Communication Networks Ingenieurwissenschaften |
url | https://doi.org/10.1007/978-3-319-61334-5 |
work_keys_str_mv | AT eloffjan softwarefailureinvestigationanearmissanalysisapproach AT bihinabellamadeleine softwarefailureinvestigationanearmissanalysisapproach |