EM Material Characterization Techniques for Metamaterials:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
Springer Singapore
2018
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Schriftenreihe: | SpringerBriefs in Electrical and Computer Engineering
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Schlagworte: | |
Online-Zugang: | BTU01 FAW01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 Volltext |
Beschreibung: | 1 Online-Ressource (XXIII, 50 p. 18 illus., 12 illus. in color) |
ISBN: | 9789811065170 |
ISSN: | 2191-8112 |
DOI: | 10.1007/978-981-10-6517-0 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV044530947 | ||
003 | DE-604 | ||
005 | 20180411 | ||
007 | cr|uuu---uuuuu | ||
008 | 171010s2018 |||| o||u| ||||||eng d | ||
020 | |a 9789811065170 |c Online |9 978-981-10-6517-0 | ||
024 | 7 | |a 10.1007/978-981-10-6517-0 |2 doi | |
035 | |a (ZDB-2-ENG)9789811065170 | ||
035 | |a (OCoLC)1011410976 | ||
035 | |a (DE-599)BVBBV044530947 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-861 |a DE-1046 |a DE-898 |a DE-92 |a DE-M347 |a DE-859 |a DE-Aug4 |a DE-862 |a DE-863 |a DE-634 |a DE-523 |a DE-706 |a DE-91 |a DE-860 |a DE-573 | ||
082 | 0 | |a 621.3 |2 23 | |
084 | |a MAS 000 |2 stub | ||
084 | |a ELT 000 |2 stub | ||
100 | 1 | |a Nair, Raveendranath U. |e Verfasser |4 aut | |
245 | 1 | 0 | |a EM Material Characterization Techniques for Metamaterials |c by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu |
264 | 1 | |a Singapore |b Springer Singapore |c 2018 | |
300 | |a 1 Online-Ressource (XXIII, 50 p. 18 illus., 12 illus. in color) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a SpringerBriefs in Electrical and Computer Engineering |x 2191-8112 | |
650 | 4 | |a Engineering | |
650 | 4 | |a Microwaves | |
650 | 4 | |a Optical engineering | |
650 | 4 | |a Electrical engineering | |
650 | 4 | |a Optical materials | |
650 | 4 | |a Electronic materials | |
650 | 4 | |a Engineering | |
650 | 4 | |a Microwaves, RF and Optical Engineering | |
650 | 4 | |a Optical and Electronic Materials | |
650 | 4 | |a Communications Engineering, Networks | |
650 | 4 | |a Ingenieurwissenschaften | |
700 | 1 | |a Dutta, Maumita |e Sonstige |4 oth | |
700 | 1 | |a P.S., Mohammed Yazeen |e Sonstige |4 oth | |
700 | 1 | |a Venu, K. S. |e Sonstige |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-10-6516-3 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-981-10-6517-0 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_2018 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-029930237 | ||
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FAW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FHM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FLA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l HTW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l TUM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-10-6517-0 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
DE-BY-FWS_katkey | 677101 |
---|---|
_version_ | 1806182748487942144 |
any_adam_object | |
author | Nair, Raveendranath U. |
author_facet | Nair, Raveendranath U. |
author_role | aut |
author_sort | Nair, Raveendranath U. |
author_variant | r u n ru run |
building | Verbundindex |
bvnumber | BV044530947 |
classification_tum | MAS 000 ELT 000 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)9789811065170 (OCoLC)1011410976 (DE-599)BVBBV044530947 |
dewey-full | 621.3 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3 |
dewey-search | 621.3 |
dewey-sort | 3621.3 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
doi_str_mv | 10.1007/978-981-10-6517-0 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03443nmm a2200721zc 4500</leader><controlfield tag="001">BV044530947</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180411 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">171010s2018 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789811065170</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-10-6517-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-981-10-6517-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9789811065170</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1011410976</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044530947</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-573</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Nair, Raveendranath U.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">EM Material Characterization Techniques for Metamaterials</subfield><subfield code="c">by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer Singapore</subfield><subfield code="c">2018</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XXIII, 50 p. 18 illus., 12 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">SpringerBriefs in Electrical and Computer Engineering</subfield><subfield code="x">2191-8112</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microwaves</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microwaves, RF and Optical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Communications Engineering, Networks</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dutta, Maumita</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">P.S., Mohammed Yazeen</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Venu, K. S.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-10-6516-3</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2018</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029930237</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FHM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">HTW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-10-6517-0</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV044530947 |
illustrated | Not Illustrated |
indexdate | 2024-08-01T13:01:37Z |
institution | BVB |
isbn | 9789811065170 |
issn | 2191-8112 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029930237 |
oclc_num | 1011410976 |
open_access_boolean | |
owner | DE-861 DE-1046 DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-Aug4 DE-862 DE-BY-FWS DE-863 DE-BY-FWS DE-634 DE-523 DE-706 DE-91 DE-BY-TUM DE-860 DE-573 |
owner_facet | DE-861 DE-1046 DE-898 DE-BY-UBR DE-92 DE-M347 DE-859 DE-Aug4 DE-862 DE-BY-FWS DE-863 DE-BY-FWS DE-634 DE-523 DE-706 DE-91 DE-BY-TUM DE-860 DE-573 |
physical | 1 Online-Ressource (XXIII, 50 p. 18 illus., 12 illus. in color) |
psigel | ZDB-2-ENG ZDB-2-ENG_2018 |
publishDate | 2018 |
publishDateSearch | 2018 |
publishDateSort | 2018 |
publisher | Springer Singapore |
record_format | marc |
series2 | SpringerBriefs in Electrical and Computer Engineering |
spellingShingle | Nair, Raveendranath U. EM Material Characterization Techniques for Metamaterials Engineering Microwaves Optical engineering Electrical engineering Optical materials Electronic materials Microwaves, RF and Optical Engineering Optical and Electronic Materials Communications Engineering, Networks Ingenieurwissenschaften |
title | EM Material Characterization Techniques for Metamaterials |
title_auth | EM Material Characterization Techniques for Metamaterials |
title_exact_search | EM Material Characterization Techniques for Metamaterials |
title_full | EM Material Characterization Techniques for Metamaterials by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu |
title_fullStr | EM Material Characterization Techniques for Metamaterials by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu |
title_full_unstemmed | EM Material Characterization Techniques for Metamaterials by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu |
title_short | EM Material Characterization Techniques for Metamaterials |
title_sort | em material characterization techniques for metamaterials |
topic | Engineering Microwaves Optical engineering Electrical engineering Optical materials Electronic materials Microwaves, RF and Optical Engineering Optical and Electronic Materials Communications Engineering, Networks Ingenieurwissenschaften |
topic_facet | Engineering Microwaves Optical engineering Electrical engineering Optical materials Electronic materials Microwaves, RF and Optical Engineering Optical and Electronic Materials Communications Engineering, Networks Ingenieurwissenschaften |
url | https://doi.org/10.1007/978-981-10-6517-0 |
work_keys_str_mv | AT nairraveendranathu emmaterialcharacterizationtechniquesformetamaterials AT duttamaumita emmaterialcharacterizationtechniquesformetamaterials AT psmohammedyazeen emmaterialcharacterizationtechniquesformetamaterials AT venuks emmaterialcharacterizationtechniquesformetamaterials |