Control of semiconductor interfaces: proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characteriz...
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| Weitere Verfasser: | , , |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam New York
Elsevier
©1994
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| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Zusammenfassung: | This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in |
| Beschreibung: | Includes bibliographical references and indexes |
| Beschreibung: | 1 online resource (xv, 583 pages) illustrations |
| ISBN: | 9781483290485 1483290484 0444818898 9780444818898 |
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| spelling | International Symposium on Control of Semiconductor Interfaces < 1993, Karuizawa, Japan> Verfasser aut Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 edited by I. Ohdomari, M. Oshima, A. Hiraki Amsterdam New York Elsevier ©1994 1 online resource (xv, 583 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and indexes This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in Semiconductors / Junctions fast Halbleitergrenzfläche swd Kongreß swd SCIENCE / Physics / Electricity bisacsh SCIENCE / Physics / Electromagnetism bisacsh Semiconductors / Junctions / Congresses Semiconductors / Junctions Semiconductors Junctions Congresses Halbleitergrenzfläche (DE-588)4158802-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Halbleitergrenzfläche (DE-588)4158802-2 s 1\p DE-604 Ohdomari, I. edt Oshima, M. edt Hiraki, A. edt Erscheint auch als Druck-Ausgabe International Symposium on Control of Semiconductor Interfaces (1st : 1993 : Karuizawa, Japan) Control of semiconductor interfaces 0444818898 http://www.sciencedirect.com/science/book/9780444818898 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 Semiconductors / Junctions fast Halbleitergrenzfläche swd Kongreß swd SCIENCE / Physics / Electricity bisacsh SCIENCE / Physics / Electromagnetism bisacsh Semiconductors / Junctions / Congresses Semiconductors / Junctions Semiconductors Junctions Congresses Halbleitergrenzfläche (DE-588)4158802-2 gnd |
| subject_GND | (DE-588)4158802-2 (DE-588)1071861417 |
| title | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 |
| title_auth | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 |
| title_exact_search | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 |
| title_full | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 edited by I. Ohdomari, M. Oshima, A. Hiraki |
| title_fullStr | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 edited by I. Ohdomari, M. Oshima, A. Hiraki |
| title_full_unstemmed | Control of semiconductor interfaces proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 edited by I. Ohdomari, M. Oshima, A. Hiraki |
| title_short | Control of semiconductor interfaces |
| title_sort | control of semiconductor interfaces proceedings of the first international symposium on control of semiconductor interfaces karuizawa japan 8 12 november 1993 |
| title_sub | proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuizawa, Japan, 8-12 November 1993 |
| topic | Semiconductors / Junctions fast Halbleitergrenzfläche swd Kongreß swd SCIENCE / Physics / Electricity bisacsh SCIENCE / Physics / Electromagnetism bisacsh Semiconductors / Junctions / Congresses Semiconductors / Junctions Semiconductors Junctions Congresses Halbleitergrenzfläche (DE-588)4158802-2 gnd |
| topic_facet | Semiconductors / Junctions Halbleitergrenzfläche Kongreß SCIENCE / Physics / Electricity SCIENCE / Physics / Electromagnetism Semiconductors / Junctions / Congresses Semiconductors Junctions Congresses Konferenzschrift |
| url | http://www.sciencedirect.com/science/book/9780444818898 |
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