Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques:
Gespeichert in:
Format: | Elektronisch E-Book |
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Sprache: | English |
Veröffentlicht: |
Amsterdam
North-Holland Pub. Co.
1978
|
Ausgabe: | 2nd, rev. ed |
Schlagworte: | |
Online-Zugang: | FAW01 Volltext |
Beschreibung: | Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science. - Reprinted 1979 Includes bibliographical references and index Diffraction and Imaging Techniques in Material Science P2 |
Beschreibung: | xvii, 457-847 pages : |
ISBN: | 9780444601865 0444601864 0444851291 9780444851291 |
Internformat
MARC
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245 | 1 | 0 | |a Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques |c editors, S. Amelinckx, R. Gevers, J. Van Landuyt |
250 | |a 2nd, rev. ed | ||
264 | 1 | |a Amsterdam |b North-Holland Pub. Co. |c 1978 | |
300 | |a xvii, 457-847 pages : | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science. - Reprinted 1979 | ||
500 | |a Includes bibliographical references and index | ||
500 | |a Diffraction and Imaging Techniques in Material Science P2 | ||
650 | 7 | |a SCIENCE / Nanoscience |2 bisacsh | |
650 | 7 | |a Electron microscopy |2 fast | |
650 | 7 | |a Electrons / Diffraction |2 fast | |
650 | 7 | |a Imaging systems |2 fast | |
650 | 4 | |a Electron microscopy |v Congresses | |
650 | 4 | |a Electrons |x Diffraction |v Congresses | |
650 | 4 | |a Imaging systems |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Amelinckx, S. |e Sonstige |4 oth | |
700 | 1 | |a Gevers, R. |e Sonstige |4 oth | |
700 | 1 | |a Landuyt, J. van |e Sonstige |4 oth | |
710 | 2 | |a International Summer Course on Material Science <1969, Antwerp, Belgium> |e Sonstige |4 oth | |
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Datensatz im Suchindex
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dewey-full | 620.1/127 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.1/127 |
dewey-search | 620.1/127 |
dewey-sort | 3620.1 3127 |
dewey-tens | 620 - Engineering and allied operations |
edition | 2nd, rev. ed |
format | Electronic eBook |
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genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV044388525 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:51:35Z |
institution | BVB |
isbn | 9780444601865 0444601864 0444851291 9780444851291 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029790747 |
oclc_num | 849926070 |
open_access_boolean | |
owner | DE-1046 |
owner_facet | DE-1046 |
physical | xvii, 457-847 pages : |
psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
publishDate | 1978 |
publishDateSearch | 1978 |
publishDateSort | 1978 |
publisher | North-Holland Pub. Co. |
record_format | marc |
spelling | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques editors, S. Amelinckx, R. Gevers, J. Van Landuyt 2nd, rev. ed Amsterdam North-Holland Pub. Co. 1978 xvii, 457-847 pages : txt rdacontent c rdamedia cr rdacarrier Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science. - Reprinted 1979 Includes bibliographical references and index Diffraction and Imaging Techniques in Material Science P2 SCIENCE / Nanoscience bisacsh Electron microscopy fast Electrons / Diffraction fast Imaging systems fast Electron microscopy Congresses Electrons Diffraction Congresses Imaging systems Congresses (DE-588)1071861417 Konferenzschrift gnd-content Amelinckx, S. Sonstige oth Gevers, R. Sonstige oth Landuyt, J. van Sonstige oth International Summer Course on Material Science <1969, Antwerp, Belgium> Sonstige oth http://www.sciencedirect.com/science/book/9780444851291 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques SCIENCE / Nanoscience bisacsh Electron microscopy fast Electrons / Diffraction fast Imaging systems fast Electron microscopy Congresses Electrons Diffraction Congresses Imaging systems Congresses |
subject_GND | (DE-588)1071861417 |
title | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques |
title_auth | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques |
title_exact_search | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques |
title_full | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques editors, S. Amelinckx, R. Gevers, J. Van Landuyt |
title_fullStr | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques editors, S. Amelinckx, R. Gevers, J. Van Landuyt |
title_full_unstemmed | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques editors, S. Amelinckx, R. Gevers, J. Van Landuyt |
title_short | Diffraction and imaging techniques in material science, Volume II, Imaging and diffraction techniques |
title_sort | diffraction and imaging techniques in material science volume ii imaging and diffraction techniques |
topic | SCIENCE / Nanoscience bisacsh Electron microscopy fast Electrons / Diffraction fast Imaging systems fast Electron microscopy Congresses Electrons Diffraction Congresses Imaging systems Congresses |
topic_facet | SCIENCE / Nanoscience Electron microscopy Electrons / Diffraction Imaging systems Electron microscopy Congresses Electrons Diffraction Congresses Imaging systems Congresses Konferenzschrift |
url | http://www.sciencedirect.com/science/book/9780444851291 |
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