Silicon-based millimeter-wave technology measurement, modeling and applications:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier/Academic Press
2012
|
| Schriftenreihe: | Advances in imaging and electron physics
v. 174 |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: Contributions from leading authorities. Informs and updates on all the latest developments in the field |
| Beschreibung: | xx, 483 pages |
| ISBN: | 9780123946362 0123946360 9780123942982 |
Internformat
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| dewey-full | 621.3815 |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:35Z |
| institution | BVB |
| isbn | 9780123946362 0123946360 9780123942982 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029790617 |
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| physical | xx, 483 pages |
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| publishDate | 2012 |
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| series2 | Advances in imaging and electron physics |
| spelling | Silicon-based millimeter-wave technology measurement, modeling and applications edited by M. Jamal Deen Amsterdam Elsevier/Academic Press 2012 xx, 483 pages txt rdacontent c rdamedia cr rdacarrier Advances in imaging and electron physics v. 174 Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: Contributions from leading authorities. Informs and updates on all the latest developments in the field Integrated circuits / Congresses Integrated circuits Semiconductors Silicon Wireless communication systems TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Millimeter wave devices fast Silicon crystals fast Millimeter wave devices Silicon crystals (DE-588)1071861417 Konferenzschrift gnd-content Cremer, Jay Theodore Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/174 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Silicon-based millimeter-wave technology measurement, modeling and applications Integrated circuits / Congresses Integrated circuits Semiconductors Silicon Wireless communication systems TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Millimeter wave devices fast Silicon crystals fast Millimeter wave devices Silicon crystals |
| subject_GND | (DE-588)1071861417 |
| title | Silicon-based millimeter-wave technology measurement, modeling and applications |
| title_auth | Silicon-based millimeter-wave technology measurement, modeling and applications |
| title_exact_search | Silicon-based millimeter-wave technology measurement, modeling and applications |
| title_full | Silicon-based millimeter-wave technology measurement, modeling and applications edited by M. Jamal Deen |
| title_fullStr | Silicon-based millimeter-wave technology measurement, modeling and applications edited by M. Jamal Deen |
| title_full_unstemmed | Silicon-based millimeter-wave technology measurement, modeling and applications edited by M. Jamal Deen |
| title_short | Silicon-based millimeter-wave technology measurement, modeling and applications |
| title_sort | silicon based millimeter wave technology measurement modeling and applications |
| topic | Integrated circuits / Congresses Integrated circuits Semiconductors Silicon Wireless communication systems TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Millimeter wave devices fast Silicon crystals fast Millimeter wave devices Silicon crystals |
| topic_facet | Integrated circuits / Congresses Integrated circuits Semiconductors Silicon Wireless communication systems TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Millimeter wave devices Silicon crystals Konferenzschrift |
| url | http://www.sciencedirect.com/science/bookseries/10765670/174 |
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