Neutron and x-ray microscopy, Part 1:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier/Academic Press
2012
|
| Ausgabe: | 1st ed |
| Schriftenreihe: | Advances in imaging and electron physics
v. 172 |
| Schlagworte: | |
| Online-Zugang: | FAW01 URL des Erstveröffentlichers |
| Beschreibung: | Title from PDF title page (viewed on July 27, 2012) Includes bibliographical references and index This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field |
| ISBN: | 9780123978141 0123978149 9780123944221 0123944228 |
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| language | English |
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| series2 | Advances in imaging and electron physics |
| spelling | Neutron and x-ray microscopy, Part 1 by Jay Theodore Cremer, Jr 1st ed Amsterdam Elsevier/Academic Press 2012 txt rdacontent c rdamedia cr rdacarrier Advances in imaging and electron physics v. 172 Title from PDF title page (viewed on July 27, 2012) Includes bibliographical references and index This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field Engineering Electrical engineering SCIENCE / Microscopes & Microscopy bisacsh X-ray microscopy fast Ingenieurwissenschaften X-ray microscopy Cremer, Jay Theodore Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/172 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Neutron and x-ray microscopy, Part 1 Engineering Electrical engineering SCIENCE / Microscopes & Microscopy bisacsh X-ray microscopy fast Ingenieurwissenschaften X-ray microscopy |
| title | Neutron and x-ray microscopy, Part 1 |
| title_auth | Neutron and x-ray microscopy, Part 1 |
| title_exact_search | Neutron and x-ray microscopy, Part 1 |
| title_full | Neutron and x-ray microscopy, Part 1 by Jay Theodore Cremer, Jr |
| title_fullStr | Neutron and x-ray microscopy, Part 1 by Jay Theodore Cremer, Jr |
| title_full_unstemmed | Neutron and x-ray microscopy, Part 1 by Jay Theodore Cremer, Jr |
| title_short | Neutron and x-ray microscopy, Part 1 |
| title_sort | neutron and x ray microscopy part 1 |
| topic | Engineering Electrical engineering SCIENCE / Microscopes & Microscopy bisacsh X-ray microscopy fast Ingenieurwissenschaften X-ray microscopy |
| topic_facet | Engineering Electrical engineering SCIENCE / Microscopes & Microscopy X-ray microscopy Ingenieurwissenschaften |
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