Advances in imaging and electron physics, Volume 160:
Gespeichert in:
Bibliographische Detailangaben
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Amsterdam, the Netherlands Academic Press, an imprint of Elsevier 2010
Ausgabe:1st ed
Schlagworte:
Online-Zugang:FAW01
URL des Erstveröffentlichers
Beschreibung:Includes bibliographical references and index
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
Beschreibung:xx, 296 pages, [4] pages of plates
ISBN:9780123810182
0123810183
9780123810175
0123810175

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