Advances in imaging and electron physics, Volume 167:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier
2011
|
| Ausgabe: | 1st ed |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians |
| Beschreibung: | xiv, 345 pages, [8] pages of plates |
| ISBN: | 9780123859860 0123859867 9780123859853 0123859859 |
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| 245 | 1 | 0 | |a Advances in imaging and electron physics, Volume 167 |c edited by Peter W. Hawkes |
| 250 | |a 1st ed | ||
| 264 | 1 | |a Amsterdam |b Elsevier |c 2011 | |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:33Z |
| institution | BVB |
| isbn | 9780123859860 0123859867 9780123859853 0123859859 |
| language | English |
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| physical | xiv, 345 pages, [8] pages of plates |
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| publishDate | 2011 |
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| spelling | Advances in imaging and electron physics, Volume 167 edited by Peter W. Hawkes 1st ed Amsterdam Elsevier 2011 xiv, 345 pages, [8] pages of plates txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians TECHNOLOGY & ENGINEERING / Imaging Systems bisacsh Electrons fast Imaging systems fast Electrons Imaging systems Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/167 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 167 TECHNOLOGY & ENGINEERING / Imaging Systems bisacsh Electrons fast Imaging systems fast Electrons Imaging systems |
| title | Advances in imaging and electron physics, Volume 167 |
| title_auth | Advances in imaging and electron physics, Volume 167 |
| title_exact_search | Advances in imaging and electron physics, Volume 167 |
| title_full | Advances in imaging and electron physics, Volume 167 edited by Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics, Volume 167 edited by Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 167 edited by Peter W. Hawkes |
| title_short | Advances in imaging and electron physics, Volume 167 |
| title_sort | advances in imaging and electron physics volume 167 |
| topic | TECHNOLOGY & ENGINEERING / Imaging Systems bisacsh Electrons fast Imaging systems fast Electrons Imaging systems |
| topic_facet | TECHNOLOGY & ENGINEERING / Imaging Systems Electrons Imaging systems |
| url | http://www.sciencedirect.com/science/bookseries/10765670/167 |
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