Advances in imaging and electron physics, Volume 162:
Gespeichert in:
Bibliographische Detailangaben
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Amsterdam Academic Press 2010
Ausgabe:1st ed
Schlagworte:
Online-Zugang:FAW01
URL des Erstveröffentlichers
Beschreibung:Includes bibliographical references and index
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry expert
Beschreibung:xiv, 275 pages, [8] pages of plates
ISBN:9780123813176
0123813174
9780123813169
0123813166

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