Identification of defects in semiconductors:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
San Diego, Calif.
Academic Press
1998
|
| Schriftenreihe: | Semiconductors and semimetals
v. 51A. |
| Schlagworte: | |
| Online-Zugang: | FAW01 URL des Erstveröffentlichers |
| Beschreibung: | Series editors: R.K. Willardson and Albert C. Beer Includes bibliographical references and indexes Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry |
| Beschreibung: | xiv, 376 pages |
| ISBN: | 0127521593 9780127521596 0080864481 9780080864488 |
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| illustrated | Not Illustrated |
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| isbn | 0127521593 9780127521596 0080864481 9780080864488 |
| language | English |
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| series2 | Semiconductors and semimetals |
| spelling | Identification of defects in semiconductors volume editor, Michael Stavola San Diego, Calif. Academic Press 1998 xiv, 376 pages txt rdacontent c rdamedia cr rdacarrier Semiconductors and semimetals v. 51A. Series editors: R.K. Willardson and Albert C. Beer Includes bibliographical references and indexes Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Integrated optics fast Laser communication systems fast Semiconductors / Defects fast Telecommunication systems fast Telecommunication systems Laser communication systems Integrated optics Semiconductors Defects Stavola, Michael Sonstige oth http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Identification of defects in semiconductors Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Integrated optics fast Laser communication systems fast Semiconductors / Defects fast Telecommunication systems fast Telecommunication systems Laser communication systems Integrated optics Semiconductors Defects |
| title | Identification of defects in semiconductors |
| title_auth | Identification of defects in semiconductors |
| title_exact_search | Identification of defects in semiconductors |
| title_full | Identification of defects in semiconductors volume editor, Michael Stavola |
| title_fullStr | Identification of defects in semiconductors volume editor, Michael Stavola |
| title_full_unstemmed | Identification of defects in semiconductors volume editor, Michael Stavola |
| title_short | Identification of defects in semiconductors |
| title_sort | identification of defects in semiconductors |
| topic | Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Integrated optics fast Laser communication systems fast Semiconductors / Defects fast Telecommunication systems fast Telecommunication systems Laser communication systems Integrated optics Semiconductors Defects |
| topic_facet | Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State TECHNOLOGY & ENGINEERING / Electronics / Semiconductors Integrated optics Laser communication systems Semiconductors / Defects Telecommunication systems Semiconductors Defects |
| url | http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA |
| work_keys_str_mv | AT stavolamichael identificationofdefectsinsemiconductors |