Identification of defects in semiconductors:
Gespeichert in:
Format: | Elektronisch E-Book |
---|---|
Sprache: | English |
Veröffentlicht: |
San Diego, Calif.
Academic Press
1998
|
Schriftenreihe: | Semiconductors and semimetals
v. 51A. |
Schlagworte: | |
Online-Zugang: | FAW01 URL des Erstveröffentlichers |
Beschreibung: | Series editors: R.K. Willardson and Albert C. Beer Includes bibliographical references and indexes Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry |
Beschreibung: | xiv, 376 pages |
ISBN: | 0127521593 9780127521596 0080864481 9780080864488 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV044386747 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 170630s1998 |||| o||u| ||||||eng d | ||
020 | |a 0127521593 |9 0-12-752159-3 | ||
020 | |a 9780127521596 |9 978-0-12-752159-6 | ||
020 | |a 0080864481 |9 0-08-086448-1 | ||
020 | |a 9780080864488 |9 978-0-08-086448-8 | ||
020 | |a 9780080864488 |9 978-0-08-086448-8 | ||
035 | |a (ZDB-33-ESD)ocn646756749 | ||
035 | |a (OCoLC)646756749 | ||
035 | |a (DE-599)BVBBV044386747 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-1046 | ||
082 | 0 | |a 621.3815/2 |2 23 | |
245 | 1 | 0 | |a Identification of defects in semiconductors |c volume editor, Michael Stavola |
264 | 1 | |a San Diego, Calif. |b Academic Press |c 1998 | |
300 | |a xiv, 376 pages | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Semiconductors and semimetals |v v. 51A. | |
500 | |a Series editors: R.K. Willardson and Albert C. Beer | ||
500 | |a Includes bibliographical references and indexes | ||
500 | |a Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry | ||
650 | 4 | |a Semiconductors | |
650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Solid State |2 bisacsh | |
650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Semiconductors |2 bisacsh | |
650 | 7 | |a Integrated optics |2 fast | |
650 | 7 | |a Laser communication systems |2 fast | |
650 | 7 | |a Semiconductors / Defects |2 fast | |
650 | 7 | |a Telecommunication systems |2 fast | |
650 | 4 | |a Telecommunication systems | |
650 | 4 | |a Laser communication systems | |
650 | 4 | |a Integrated optics | |
650 | 4 | |a Semiconductors |x Defects | |
700 | 1 | |a Stavola, Michael |e Sonstige |4 oth | |
856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-33-ESD | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-029788968 | ||
966 | e | |u http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804177655099031552 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV044386747 |
collection | ZDB-33-ESD |
ctrlnum | (ZDB-33-ESD)ocn646756749 (OCoLC)646756749 (DE-599)BVBBV044386747 |
dewey-full | 621.3815/2 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/2 |
dewey-search | 621.3815/2 |
dewey-sort | 3621.3815 12 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03367nmm a2200541zcb4500</leader><controlfield tag="001">BV044386747</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s1998 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0127521593</subfield><subfield code="9">0-12-752159-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780127521596</subfield><subfield code="9">978-0-12-752159-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080864481</subfield><subfield code="9">0-08-086448-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080864488</subfield><subfield code="9">978-0-08-086448-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080864488</subfield><subfield code="9">978-0-08-086448-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn646756749</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)646756749</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044386747</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Identification of defects in semiconductors</subfield><subfield code="c">volume editor, Michael Stavola</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">San Diego, Calif.</subfield><subfield code="b">Academic Press</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiv, 376 pages</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Semiconductors and semimetals</subfield><subfield code="v">v. 51A.</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Series editors: R.K. Willardson and Albert C. Beer</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and indexes</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Solid State</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Semiconductors</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Integrated optics</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Laser communication systems</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductors / Defects</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Telecommunication systems</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Telecommunication systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Laser communication systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated optics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Stavola, Michael</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029788968</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV044386747 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:51:31Z |
institution | BVB |
isbn | 0127521593 9780127521596 0080864481 9780080864488 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029788968 |
oclc_num | 646756749 |
open_access_boolean | |
owner | DE-1046 |
owner_facet | DE-1046 |
physical | xiv, 376 pages |
psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | Academic Press |
record_format | marc |
series2 | Semiconductors and semimetals |
spelling | Identification of defects in semiconductors volume editor, Michael Stavola San Diego, Calif. Academic Press 1998 xiv, 376 pages txt rdacontent c rdamedia cr rdacarrier Semiconductors and semimetals v. 51A. Series editors: R.K. Willardson and Albert C. Beer Includes bibliographical references and indexes Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Integrated optics fast Laser communication systems fast Semiconductors / Defects fast Telecommunication systems fast Telecommunication systems Laser communication systems Integrated optics Semiconductors Defects Stavola, Michael Sonstige oth http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Identification of defects in semiconductors Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Integrated optics fast Laser communication systems fast Semiconductors / Defects fast Telecommunication systems fast Telecommunication systems Laser communication systems Integrated optics Semiconductors Defects |
title | Identification of defects in semiconductors |
title_auth | Identification of defects in semiconductors |
title_exact_search | Identification of defects in semiconductors |
title_full | Identification of defects in semiconductors volume editor, Michael Stavola |
title_fullStr | Identification of defects in semiconductors volume editor, Michael Stavola |
title_full_unstemmed | Identification of defects in semiconductors volume editor, Michael Stavola |
title_short | Identification of defects in semiconductors |
title_sort | identification of defects in semiconductors |
topic | Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Integrated optics fast Laser communication systems fast Semiconductors / Defects fast Telecommunication systems fast Telecommunication systems Laser communication systems Integrated optics Semiconductors Defects |
topic_facet | Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State TECHNOLOGY & ENGINEERING / Electronics / Semiconductors Integrated optics Laser communication systems Semiconductors / Defects Telecommunication systems Semiconductors Defects |
url | http://www.sciencedirect.com/science/bookseries/00808784/51/part/PA |
work_keys_str_mv | AT stavolamichael identificationofdefectsinsemiconductors |