Size effects in thin films:
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Bibliographic Details
Main Author: Tellier, C. R., (Colette R.) (Author)
Format: Electronic eBook
Language:English
Published: Amsterdam Elsevier 1982
Series:Thin films science and technology 2
Subjects:
Online Access:FAW01
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Item Description:Includes bibliographical references and indexes
A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.<br><br>
Physical Description:ix, 310 pages
ISBN:9781483289762
1483289761
0444421068
9780444421067
0444419039
9780444419033

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