Optics of charged particle analyzers:
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Bibliographic Details
Main Author: Yavor, Mikhail (Author)
Format: Electronic eBook
Language:English
Published: Amsterdam Academic Press 2009
Edition:1st ed
Series:Advances in imaging and electron physics 157
Subjects:
Online Access:FAW01
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Item Description:Included bibliographical references and index
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
Physical Description:xxiii, 381 pages
ISBN:9780080912165
0080912168
9780123747686
0123747686

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