Optics of charged particle analyzers:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Academic Press
2009
|
| Ausgabe: | 1st ed |
| Schriftenreihe: | Advances in imaging and electron physics
157 |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Included bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians |
| Beschreibung: | xxiii, 381 pages |
| ISBN: | 9780080912165 0080912168 9780123747686 0123747686 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044385225 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s2009 |||| o||u| ||||||eng d | ||
| 020 | |a 9780080912165 |9 978-0-08-091216-5 | ||
| 020 | |a 0080912168 |9 0-08-091216-8 | ||
| 020 | |a 9780123747686 |9 978-0-12-374768-6 | ||
| 020 | |a 0123747686 |9 0-12-374768-6 | ||
| 035 | |a (ZDB-33-ESD)ocn460057412 | ||
| 035 | |a (OCoLC)460057412 | ||
| 035 | |a (DE-599)BVBBV044385225 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 539.7/2028/4 |2 22 | |
| 100 | 1 | |a Yavor, Mikhail |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Optics of charged particle analyzers |c Mikhail Yavor |
| 250 | |a 1st ed | ||
| 264 | 1 | |a Amsterdam |b Academic Press |c 2009 | |
| 300 | |a xxiii, 381 pages | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics |v 157 | |
| 500 | |a Included bibliographical references and index | ||
| 500 | |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians | ||
| 650 | 7 | |a SCIENCE / Physics / Nuclear |2 bisacsh | |
| 650 | 7 | |a SCIENCE / Physics / Atomic & Molecular |2 bisacsh | |
| 650 | 7 | |a Electron optics |2 fast | |
| 650 | 7 | |a Nuclear physics / Instruments |2 fast | |
| 650 | 7 | |a Particles (Nuclear physics) |2 fast | |
| 650 | 4 | |a Particles (Nuclear physics) | |
| 650 | 4 | |a Electron optics | |
| 650 | 4 | |a Nuclear physics |x Instruments | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/10765670/157 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029787446 | ||
| 966 | e | |u http://www.sciencedirect.com/science/bookseries/10765670/157 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804177652043481088 |
|---|---|
| any_adam_object | |
| author | Yavor, Mikhail |
| author_facet | Yavor, Mikhail |
| author_role | aut |
| author_sort | Yavor, Mikhail |
| author_variant | m y my |
| building | Verbundindex |
| bvnumber | BV044385225 |
| collection | ZDB-33-ESD ZDB-33-EBS |
| ctrlnum | (ZDB-33-ESD)ocn460057412 (OCoLC)460057412 (DE-599)BVBBV044385225 |
| dewey-full | 539.7/2028/4 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
| dewey-raw | 539.7/2028/4 |
| dewey-search | 539.7/2028/4 |
| dewey-sort | 3539.7 42028 14 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 1st ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02474nmm a2200493zcb4500</leader><controlfield tag="001">BV044385225</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s2009 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080912165</subfield><subfield code="9">978-0-08-091216-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080912168</subfield><subfield code="9">0-08-091216-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780123747686</subfield><subfield code="9">978-0-12-374768-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0123747686</subfield><subfield code="9">0-12-374768-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn460057412</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)460057412</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044385225</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">539.7/2028/4</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Yavor, Mikhail</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Optics of charged particle analyzers</subfield><subfield code="c">Mikhail Yavor</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Academic Press</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxiii, 381 pages</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advances in imaging and electron physics</subfield><subfield code="v">157</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Included bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Nuclear</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Atomic & Molecular</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron optics</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Nuclear physics / Instruments</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Particles (Nuclear physics)</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Particles (Nuclear physics)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron optics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nuclear physics</subfield><subfield code="x">Instruments</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/157</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029787446</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/157</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044385225 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:28Z |
| institution | BVB |
| isbn | 9780080912165 0080912168 9780123747686 0123747686 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029787446 |
| oclc_num | 460057412 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | xxiii, 381 pages |
| psigel | ZDB-33-ESD ZDB-33-EBS ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Academic Press |
| record_format | marc |
| series2 | Advances in imaging and electron physics |
| spelling | Yavor, Mikhail Verfasser aut Optics of charged particle analyzers Mikhail Yavor 1st ed Amsterdam Academic Press 2009 xxiii, 381 pages txt rdacontent c rdamedia cr rdacarrier Advances in imaging and electron physics 157 Included bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians SCIENCE / Physics / Nuclear bisacsh SCIENCE / Physics / Atomic & Molecular bisacsh Electron optics fast Nuclear physics / Instruments fast Particles (Nuclear physics) fast Particles (Nuclear physics) Electron optics Nuclear physics Instruments http://www.sciencedirect.com/science/bookseries/10765670/157 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Yavor, Mikhail Optics of charged particle analyzers SCIENCE / Physics / Nuclear bisacsh SCIENCE / Physics / Atomic & Molecular bisacsh Electron optics fast Nuclear physics / Instruments fast Particles (Nuclear physics) fast Particles (Nuclear physics) Electron optics Nuclear physics Instruments |
| title | Optics of charged particle analyzers |
| title_auth | Optics of charged particle analyzers |
| title_exact_search | Optics of charged particle analyzers |
| title_full | Optics of charged particle analyzers Mikhail Yavor |
| title_fullStr | Optics of charged particle analyzers Mikhail Yavor |
| title_full_unstemmed | Optics of charged particle analyzers Mikhail Yavor |
| title_short | Optics of charged particle analyzers |
| title_sort | optics of charged particle analyzers |
| topic | SCIENCE / Physics / Nuclear bisacsh SCIENCE / Physics / Atomic & Molecular bisacsh Electron optics fast Nuclear physics / Instruments fast Particles (Nuclear physics) fast Particles (Nuclear physics) Electron optics Nuclear physics Instruments |
| topic_facet | SCIENCE / Physics / Nuclear SCIENCE / Physics / Atomic & Molecular Electron optics Nuclear physics / Instruments Particles (Nuclear physics) Nuclear physics Instruments |
| url | http://www.sciencedirect.com/science/bookseries/10765670/157 |
| work_keys_str_mv | AT yavormikhail opticsofchargedparticleanalyzers |