The spectroscopy of semiconductors:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston
Academic Press
©1992
|
| Schriftenreihe: | Semiconductors and semimetals
v. 36 |
| Schlagworte: | |
| Online-Zugang: | FAW01 URL des Erstveröffentlichers |
| Beschreibung: | Includes bibliographical references and index Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures. Key Features * Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors * Features detailed review articles which cover basic principles * Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures |
| Beschreibung: | xiii, 435 pages |
| ISBN: | 9780080864334 0080864333 0127521364 9780127521367 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044384809 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s1992 |||| o||u| ||||||eng d | ||
| 020 | |a 9780080864334 |9 978-0-08-086433-4 | ||
| 020 | |a 0080864333 |9 0-08-086433-3 | ||
| 020 | |a 0127521364 |9 0-12-752136-4 | ||
| 020 | |a 9780127521367 |9 978-0-12-752136-7 | ||
| 035 | |a (ZDB-33-ESD)ocn298460502 | ||
| 035 | |a (OCoLC)298460502 | ||
| 035 | |a (DE-599)BVBBV044384809 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 537.6/22 |2 22 | |
| 245 | 1 | 0 | |a The spectroscopy of semiconductors |c volume editors, David G. Seiler, Christopher L. Littler |
| 264 | 1 | |a Boston |b Academic Press |c ©1992 | |
| 300 | |a xiii, 435 pages | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Semiconductors and semimetals |v v. 36 | |
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures. Key Features * Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors * Features detailed review articles which cover basic principles * Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures | ||
| 650 | 4 | |a Semiconductors | |
| 650 | 4 | |a Spectrum analysis | |
| 650 | 7 | |a SCIENCE / Physics / Electricity |2 bisacsh | |
| 650 | 7 | |a Semiconductors / Optical properties |2 fast | |
| 650 | 7 | |a Spectrum analysis |2 fast | |
| 650 | 4 | |a Semiconductors |x Optical properties | |
| 650 | 4 | |a Spectrum analysis | |
| 700 | 1 | |a Seiler, David G. |e Sonstige |4 oth | |
| 700 | 1 | |a Littler, C. L. |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/00808784/36 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029787030 | ||
| 966 | e | |u http://www.sciencedirect.com/science/bookseries/00808784/36 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804177651266486272 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044384809 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocn298460502 (OCoLC)298460502 (DE-599)BVBBV044384809 |
| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02885nmm a2200481zcb4500</leader><controlfield tag="001">BV044384809</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s1992 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080864334</subfield><subfield code="9">978-0-08-086433-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080864333</subfield><subfield code="9">0-08-086433-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0127521364</subfield><subfield code="9">0-12-752136-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780127521367</subfield><subfield code="9">978-0-12-752136-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn298460502</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)298460502</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044384809</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.6/22</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">The spectroscopy of semiconductors</subfield><subfield code="c">volume editors, David G. Seiler, Christopher L. Littler</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Academic Press</subfield><subfield code="c">©1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 435 pages</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Semiconductors and semimetals</subfield><subfield code="v">v. 36</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures. Key Features * Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors * Features detailed review articles which cover basic principles * Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Electricity</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductors / Optical properties</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Spectrum analysis</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Optical properties</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Seiler, David G.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Littler, C. L.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/00808784/36</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029787030</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/00808784/36</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044384809 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:28Z |
| institution | BVB |
| isbn | 9780080864334 0080864333 0127521364 9780127521367 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029787030 |
| oclc_num | 298460502 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | xiii, 435 pages |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Academic Press |
| record_format | marc |
| series2 | Semiconductors and semimetals |
| spelling | The spectroscopy of semiconductors volume editors, David G. Seiler, Christopher L. Littler Boston Academic Press ©1992 xiii, 435 pages txt rdacontent c rdamedia cr rdacarrier Semiconductors and semimetals v. 36 Includes bibliographical references and index Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures. Key Features * Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors * Features detailed review articles which cover basic principles * Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures Semiconductors Spectrum analysis SCIENCE / Physics / Electricity bisacsh Semiconductors / Optical properties fast Spectrum analysis fast Semiconductors Optical properties Seiler, David G. Sonstige oth Littler, C. L. Sonstige oth http://www.sciencedirect.com/science/bookseries/00808784/36 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | The spectroscopy of semiconductors Semiconductors Spectrum analysis SCIENCE / Physics / Electricity bisacsh Semiconductors / Optical properties fast Spectrum analysis fast Semiconductors Optical properties |
| title | The spectroscopy of semiconductors |
| title_auth | The spectroscopy of semiconductors |
| title_exact_search | The spectroscopy of semiconductors |
| title_full | The spectroscopy of semiconductors volume editors, David G. Seiler, Christopher L. Littler |
| title_fullStr | The spectroscopy of semiconductors volume editors, David G. Seiler, Christopher L. Littler |
| title_full_unstemmed | The spectroscopy of semiconductors volume editors, David G. Seiler, Christopher L. Littler |
| title_short | The spectroscopy of semiconductors |
| title_sort | the spectroscopy of semiconductors |
| topic | Semiconductors Spectrum analysis SCIENCE / Physics / Electricity bisacsh Semiconductors / Optical properties fast Spectrum analysis fast Semiconductors Optical properties |
| topic_facet | Semiconductors Spectrum analysis SCIENCE / Physics / Electricity Semiconductors / Optical properties Semiconductors Optical properties |
| url | http://www.sciencedirect.com/science/bookseries/00808784/36 |
| work_keys_str_mv | AT seilerdavidg thespectroscopyofsemiconductors AT littlercl thespectroscopyofsemiconductors |