Advances in imaging and electron physics, Volume 150:
Gespeichert in:
Format: | Elektronisch E-Book |
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Sprache: | English |
Veröffentlicht: |
Amsterdam
Elsevier/Academic Press
©2008
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Schlagworte: | |
Online-Zugang: | FAW01 URL des Erstveröffentlichers |
Beschreibung: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing. * Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians |
Beschreibung: | 1 volume |
ISBN: | 9780080569123 0080569129 9780123742179 012374217X |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV044384093 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 170630s2008 |||| o||u| ||||||eng d | ||
020 | |a 9780080569123 |9 978-0-08-056912-3 | ||
020 | |a 0080569129 |9 0-08-056912-9 | ||
020 | |a 9780123742179 |9 978-0-12-374217-9 | ||
020 | |a 012374217X |9 0-12-374217-X | ||
035 | |a (ZDB-33-ESD)ocn241284415 | ||
035 | |a (OCoLC)241284415 | ||
035 | |a (DE-599)BVBBV044384093 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-1046 | ||
082 | 0 | |a 621.367 |2 22 | |
245 | 1 | 0 | |a Advances in imaging and electron physics, Volume 150 |c edited by Peter W. Hawkes |
264 | 1 | |a Amsterdam |b Elsevier/Academic Press |c ©2008 | |
300 | |a 1 volume | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Includes bibliographical references and index | ||
500 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing. * Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians | ||
650 | 7 | |a TECHNOLOGY & ENGINEERING / Imaging Systems |2 bisacsh | |
650 | 7 | |a Optical data processing |2 fast | |
650 | 7 | |a Optoelectronic devices |2 fast | |
650 | 4 | |a Optoelectronic devices | |
650 | 4 | |a Optical data processing | |
700 | 1 | |a Hawkes, Peter W. |e Sonstige |4 oth | |
856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/10765670/150 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-029786314 | ||
966 | e | |u http://www.sciencedirect.com/science/bookseries/10765670/150 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804177649891803136 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV044384093 |
collection | ZDB-33-ESD ZDB-33-EBS |
ctrlnum | (ZDB-33-ESD)ocn241284415 (OCoLC)241284415 (DE-599)BVBBV044384093 |
dewey-full | 621.367 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.367 |
dewey-search | 621.367 |
dewey-sort | 3621.367 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03143nmm a2200433zc 4500</leader><controlfield tag="001">BV044384093</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s2008 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080569123</subfield><subfield code="9">978-0-08-056912-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080569129</subfield><subfield code="9">0-08-056912-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780123742179</subfield><subfield code="9">978-0-12-374217-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">012374217X</subfield><subfield code="9">0-12-374217-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn241284415</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)241284415</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044384093</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.367</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advances in imaging and electron physics, Volume 150</subfield><subfield code="c">edited by Peter W. Hawkes</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Elsevier/Academic Press</subfield><subfield code="c">©2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 volume</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing. * Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Imaging Systems</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Optical data processing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Optoelectronic devices</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optoelectronic devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical data processing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hawkes, Peter W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/150</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029786314</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/150</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV044384093 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:51:26Z |
institution | BVB |
isbn | 9780080569123 0080569129 9780123742179 012374217X |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029786314 |
oclc_num | 241284415 |
open_access_boolean | |
owner | DE-1046 |
owner_facet | DE-1046 |
physical | 1 volume |
psigel | ZDB-33-ESD ZDB-33-EBS ZDB-33-ESD FAW_PDA_ESD |
publishDate | 2008 |
publishDateSearch | 2008 |
publishDateSort | 2008 |
publisher | Elsevier/Academic Press |
record_format | marc |
spelling | Advances in imaging and electron physics, Volume 150 edited by Peter W. Hawkes Amsterdam Elsevier/Academic Press ©2008 1 volume txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as "Academic Press, 1994" (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, 'Computer Techniques for Image Processing in Electron Microscopy', Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing. * Updated with contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians TECHNOLOGY & ENGINEERING / Imaging Systems bisacsh Optical data processing fast Optoelectronic devices fast Optoelectronic devices Optical data processing Hawkes, Peter W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/150 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Advances in imaging and electron physics, Volume 150 TECHNOLOGY & ENGINEERING / Imaging Systems bisacsh Optical data processing fast Optoelectronic devices fast Optoelectronic devices Optical data processing |
title | Advances in imaging and electron physics, Volume 150 |
title_auth | Advances in imaging and electron physics, Volume 150 |
title_exact_search | Advances in imaging and electron physics, Volume 150 |
title_full | Advances in imaging and electron physics, Volume 150 edited by Peter W. Hawkes |
title_fullStr | Advances in imaging and electron physics, Volume 150 edited by Peter W. Hawkes |
title_full_unstemmed | Advances in imaging and electron physics, Volume 150 edited by Peter W. Hawkes |
title_short | Advances in imaging and electron physics, Volume 150 |
title_sort | advances in imaging and electron physics volume 150 |
topic | TECHNOLOGY & ENGINEERING / Imaging Systems bisacsh Optical data processing fast Optoelectronic devices fast Optoelectronic devices Optical data processing |
topic_facet | TECHNOLOGY & ENGINEERING / Imaging Systems Optical data processing Optoelectronic devices |
url | http://www.sciencedirect.com/science/bookseries/10765670/150 |
work_keys_str_mv | AT hawkespeterw advancesinimagingandelectronphysicsvolume150 |