Electron-beam-induced nanometer-scale deposition:
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Bibliographic Details
Format: Electronic eBook
Language:English
Published: Amsterdam Elsevier Academic Press ©2006
Series:Advances in imaging and electron physics v. 143
Subjects:
Online Access:FAW01
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Item Description:Includes bibliographical references (pages 219-235) and index
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
Physical Description:xv, 247 pages
ISBN:9780080465357
0080465358
0120147858
9780120147854

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