Advances in imaging and electron physics, Volume 136:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier Academic Press
©2005
|
| Schriftenreihe: | Advances in imaging and electron physics
136 |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains |
| Beschreibung: | xv, 333 pages |
| ISBN: | 0080458556 9780080458557 0120147785 9780120147786 |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:26Z |
| institution | BVB |
| isbn | 0080458556 9780080458557 0120147785 9780120147786 |
| language | English |
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| physical | xv, 333 pages |
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| series2 | Advances in imaging and electron physics |
| spelling | Advances in imaging and electron physics, Volume 136 edited by Peter W. Hawkes Amsterdam Elsevier Academic Press ©2005 xv, 333 pages txt rdacontent c rdamedia cr rdacarrier Advances in imaging and electron physics 136 Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopy fast Image processing fast Image processing Electron microscopy Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/136 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 136 SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopy fast Image processing fast Image processing Electron microscopy |
| title | Advances in imaging and electron physics, Volume 136 |
| title_auth | Advances in imaging and electron physics, Volume 136 |
| title_exact_search | Advances in imaging and electron physics, Volume 136 |
| title_full | Advances in imaging and electron physics, Volume 136 edited by Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics, Volume 136 edited by Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 136 edited by Peter W. Hawkes |
| title_short | Advances in imaging and electron physics, Volume 136 |
| title_sort | advances in imaging and electron physics volume 136 |
| topic | SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopy fast Image processing fast Image processing Electron microscopy |
| topic_facet | SCIENCE / Physics / Electromagnetism SCIENCE / Physics / Electricity Electron microscopy Image processing |
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