Advances in imaging and electron physics, Volume 135:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier Academic Press
©2005
|
| Schriftenreihe: | Advances in imaging and electron physics
135 |
| Schlagworte: | |
| Online-Zugang: | FAW01 URL des Erstveröffentlichers |
| Beschreibung: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains |
| Beschreibung: | xv, 347 pages |
| ISBN: | 0080458548 9780080458540 0120147777 9780120147779 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044383700 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s2005 |||| o||u| ||||||eng d | ||
| 020 | |a 0080458548 |9 0-08-045854-8 | ||
| 020 | |a 9780080458540 |9 978-0-08-045854-0 | ||
| 020 | |a 0120147777 |9 0-12-014777-7 | ||
| 020 | |a 9780120147779 |9 978-0-12-014777-9 | ||
| 035 | |a (ZDB-33-ESD)ocm76699854 | ||
| 035 | |a (OCoLC)76699854 | ||
| 035 | |a (DE-599)BVBBV044383700 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 537.5/6 |2 22 | |
| 245 | 1 | 0 | |a Advances in imaging and electron physics, Volume 135 |c edited by Peter W. Hawkes |
| 264 | 1 | |a Amsterdam |b Elsevier Academic Press |c ©2005 | |
| 300 | |a xv, 347 pages | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics |v 135 | |
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains | ||
| 650 | 7 | |a SCIENCE / Physics / Electromagnetism |2 bisacsh | |
| 650 | 7 | |a SCIENCE / Physics / Electricity |2 bisacsh | |
| 650 | 7 | |a Atomic force microscopy |2 fast | |
| 650 | 7 | |a Cyclostationary waves |2 fast | |
| 650 | 7 | |a Image processing |2 fast | |
| 650 | 7 | |a Semiconductor lasers |2 fast | |
| 650 | 7 | |a Spectrum analysis |2 fast | |
| 650 | 4 | |a Image processing | |
| 650 | 4 | |a Atomic force microscopy | |
| 650 | 4 | |a Spectrum analysis | |
| 650 | 4 | |a Cyclostationary waves | |
| 650 | 4 | |a Semiconductor lasers | |
| 700 | 1 | |a Hawkes, P. W. |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/10765670/135 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029785921 | ||
| 966 | e | |u http://www.sciencedirect.com/science/bookseries/10765670/135 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804177649115856896 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044383700 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocm76699854 (OCoLC)76699854 (DE-599)BVBBV044383700 |
| dewey-full | 537.5/6 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.5/6 |
| dewey-search | 537.5/6 |
| dewey-sort | 3537.5 16 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02372nmm a2200529zcb4500</leader><controlfield tag="001">BV044383700</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s2005 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080458548</subfield><subfield code="9">0-08-045854-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080458540</subfield><subfield code="9">978-0-08-045854-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0120147777</subfield><subfield code="9">0-12-014777-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780120147779</subfield><subfield code="9">978-0-12-014777-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocm76699854</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)76699854</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044383700</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.5/6</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advances in imaging and electron physics, Volume 135</subfield><subfield code="c">edited by Peter W. Hawkes</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Elsevier Academic Press</subfield><subfield code="c">©2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xv, 347 pages</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advances in imaging and electron physics</subfield><subfield code="v">135</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Electromagnetism</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Electricity</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Atomic force microscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Cyclostationary waves</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Image processing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductor lasers</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Spectrum analysis</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Image processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Atomic force microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Cyclostationary waves</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor lasers</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hawkes, P. W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/135</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029785921</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/135</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044383700 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:26Z |
| institution | BVB |
| isbn | 0080458548 9780080458540 0120147777 9780120147779 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029785921 |
| oclc_num | 76699854 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | xv, 347 pages |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Elsevier Academic Press |
| record_format | marc |
| series2 | Advances in imaging and electron physics |
| spelling | Advances in imaging and electron physics, Volume 135 edited by Peter W. Hawkes Amsterdam Elsevier Academic Press ©2005 xv, 347 pages txt rdacontent c rdamedia cr rdacarrier Advances in imaging and electron physics 135 Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Atomic force microscopy fast Cyclostationary waves fast Image processing fast Semiconductor lasers fast Spectrum analysis fast Image processing Atomic force microscopy Spectrum analysis Cyclostationary waves Semiconductor lasers Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/135 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 135 SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Atomic force microscopy fast Cyclostationary waves fast Image processing fast Semiconductor lasers fast Spectrum analysis fast Image processing Atomic force microscopy Spectrum analysis Cyclostationary waves Semiconductor lasers |
| title | Advances in imaging and electron physics, Volume 135 |
| title_auth | Advances in imaging and electron physics, Volume 135 |
| title_exact_search | Advances in imaging and electron physics, Volume 135 |
| title_full | Advances in imaging and electron physics, Volume 135 edited by Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics, Volume 135 edited by Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 135 edited by Peter W. Hawkes |
| title_short | Advances in imaging and electron physics, Volume 135 |
| title_sort | advances in imaging and electron physics volume 135 |
| topic | SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Atomic force microscopy fast Cyclostationary waves fast Image processing fast Semiconductor lasers fast Spectrum analysis fast Image processing Atomic force microscopy Spectrum analysis Cyclostationary waves Semiconductor lasers |
| topic_facet | SCIENCE / Physics / Electromagnetism SCIENCE / Physics / Electricity Atomic force microscopy Cyclostationary waves Image processing Semiconductor lasers Spectrum analysis |
| url | http://www.sciencedirect.com/science/bookseries/10765670/135 |
| work_keys_str_mv | AT hawkespw advancesinimagingandelectronphysicsvolume135 |