Advances in imaging and electron physics:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
San Diego
Academic Press
2007
|
| Schlagworte: | |
| Online-Zugang: | FAW01 URL des Erstveröffentlichers |
| Beschreibung: | Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains |
| Beschreibung: | xvi, 209 pages |
| ISBN: | 0123739098 9780123739094 1281003654 9781281003652 1281052299 9781281052292 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044381538 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s2007 |||| o||u| ||||||eng d | ||
| 020 | |a 0123739098 |9 0-12-373909-8 | ||
| 020 | |a 9780123739094 |9 978-0-12-373909-4 | ||
| 020 | |a 1281003654 |9 1-281-00365-4 | ||
| 020 | |a 9781281003652 |9 978-1-281-00365-2 | ||
| 020 | |a 1281052299 |9 1-281-05229-9 | ||
| 020 | |a 9781281052292 |9 978-1-281-05229-2 | ||
| 035 | |a (ZDB-33-ESD)ocn648314511 | ||
| 035 | |a (OCoLC)648314511 | ||
| 035 | |a (DE-599)BVBBV044381538 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 537.5/6 |2 22 | |
| 245 | 1 | 0 | |a Advances in imaging and electron physics |c edited by Peter W. Hawkes |
| 264 | 1 | |a San Diego |b Academic Press |c 2007 | |
| 300 | |a xvi, 209 pages | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains | ||
| 650 | 7 | |a Electron microscopy |2 fast | |
| 650 | 7 | |a Electron optics |2 fast | |
| 650 | 7 | |a Electronics |2 fast | |
| 650 | 7 | |a Imaging systems |2 fast | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Imaging systems | |
| 650 | 4 | |a Electron optics | |
| 650 | 4 | |a Electron microscopy | |
| 700 | 1 | |a Hawkes, P. W. |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/10765670/147 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029783760 | ||
| 966 | e | |u http://www.sciencedirect.com/science/bookseries/10765670/147 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804177644919455744 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044381538 |
| collection | ZDB-33-ESD ZDB-33-EBS |
| ctrlnum | (ZDB-33-ESD)ocn648314511 (OCoLC)648314511 (DE-599)BVBBV044381538 |
| dewey-full | 537.5/6 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.5/6 |
| dewey-search | 537.5/6 |
| dewey-sort | 3537.5 16 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02098nmm a2200481zc 4500</leader><controlfield tag="001">BV044381538</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s2007 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0123739098</subfield><subfield code="9">0-12-373909-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780123739094</subfield><subfield code="9">978-0-12-373909-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1281003654</subfield><subfield code="9">1-281-00365-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781281003652</subfield><subfield code="9">978-1-281-00365-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1281052299</subfield><subfield code="9">1-281-05229-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781281052292</subfield><subfield code="9">978-1-281-05229-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn648314511</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)648314511</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044381538</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.5/6</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advances in imaging and electron physics</subfield><subfield code="c">edited by Peter W. Hawkes</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">San Diego</subfield><subfield code="b">Academic Press</subfield><subfield code="c">2007</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvi, 209 pages</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron microscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron optics</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronics</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Imaging systems</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Imaging systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron optics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hawkes, P. W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/147</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029783760</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/147</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044381538 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:22Z |
| institution | BVB |
| isbn | 0123739098 9780123739094 1281003654 9781281003652 1281052299 9781281052292 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029783760 |
| oclc_num | 648314511 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | xvi, 209 pages |
| psigel | ZDB-33-ESD ZDB-33-EBS ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Academic Press |
| record_format | marc |
| spelling | Advances in imaging and electron physics edited by Peter W. Hawkes San Diego Academic Press 2007 xvi, 209 pages txt rdacontent c rdamedia cr rdacarrier Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains Electron microscopy fast Electron optics fast Electronics fast Imaging systems fast Electronics Imaging systems Electron optics Electron microscopy Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/147 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics Electron microscopy fast Electron optics fast Electronics fast Imaging systems fast Electronics Imaging systems Electron optics Electron microscopy |
| title | Advances in imaging and electron physics |
| title_auth | Advances in imaging and electron physics |
| title_exact_search | Advances in imaging and electron physics |
| title_full | Advances in imaging and electron physics edited by Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics edited by Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics edited by Peter W. Hawkes |
| title_short | Advances in imaging and electron physics |
| title_sort | advances in imaging and electron physics |
| topic | Electron microscopy fast Electron optics fast Electronics fast Imaging systems fast Electronics Imaging systems Electron optics Electron microscopy |
| topic_facet | Electron microscopy Electron optics Electronics Imaging systems |
| url | http://www.sciencedirect.com/science/bookseries/10765670/147 |
| work_keys_str_mv | AT hawkespw advancesinimagingandelectronphysics |