Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Academic Press
2008
|
| Ausgabe: | 1st ed |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references and index The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called 'limit of resolution' of the microscope was well understood but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopical imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals |
| Beschreibung: | xix, 538 pages |
| ISBN: | 9780123742209 012374220X 9780080880358 |
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| 245 | 1 | 0 | |a Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy |c Peter W. Hawkes |
| 246 | 1 | 3 | |a Aberration-corrected microscopy |
| 250 | |a 1st ed | ||
| 264 | 1 | |a Amsterdam |b Academic Press |c 2008 | |
| 300 | |a xix, 538 pages | ||
| 336 | |b txt |2 rdacontent | ||
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| 500 | |a Includes bibliographical references and index | ||
| 500 | |a The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called 'limit of resolution' of the microscope was well understood but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopical imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals | ||
| 650 | 7 | |a Aberration |2 fast | |
| 650 | 7 | |a Optical data processing |2 fast | |
| 650 | 7 | |a Optoelectronic devices |2 fast | |
| 650 | 7 | |a Scanning transmission electron microscopy |2 fast | |
| 650 | 7 | |a Transmission electron microscopy |2 fast | |
| 650 | 4 | |a Optoelectronic devices | |
| 650 | 4 | |a Optical data processing | |
| 650 | 4 | |a Transmission electron microscopy | |
| 650 | 4 | |a Scanning transmission electron microscopy | |
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| dewey-ones | 621 - Applied physics |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1st ed |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:21Z |
| institution | BVB |
| isbn | 9780123742209 012374220X 9780080880358 |
| language | English |
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| physical | xix, 538 pages |
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| publishDate | 2008 |
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| spelling | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy Peter W. Hawkes Aberration-corrected microscopy 1st ed Amsterdam Academic Press 2008 xix, 538 pages txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called 'limit of resolution' of the microscope was well understood but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopical imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals Aberration fast Optical data processing fast Optoelectronic devices fast Scanning transmission electron microscopy fast Transmission electron microscopy fast Optoelectronic devices Optical data processing Transmission electron microscopy Scanning transmission electron microscopy Aberration Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/153 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy Aberration fast Optical data processing fast Optoelectronic devices fast Scanning transmission electron microscopy fast Transmission electron microscopy fast Optoelectronic devices Optical data processing Transmission electron microscopy Scanning transmission electron microscopy Aberration |
| title | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy |
| title_alt | Aberration-corrected microscopy |
| title_auth | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy |
| title_exact_search | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy |
| title_full | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy Peter W. Hawkes |
| title_short | Advances in imaging and electron physics, Volume 153, Aberration-corrected microscopy |
| title_sort | advances in imaging and electron physics volume 153 aberration corrected microscopy |
| topic | Aberration fast Optical data processing fast Optoelectronic devices fast Scanning transmission electron microscopy fast Transmission electron microscopy fast Optoelectronic devices Optical data processing Transmission electron microscopy Scanning transmission electron microscopy Aberration |
| topic_facet | Aberration Optical data processing Optoelectronic devices Scanning transmission electron microscopy Transmission electron microscopy |
| url | http://www.sciencedirect.com/science/bookseries/10765670/153 |
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