Electron nano-imaging: basics of imaging and diffraction for TEM and STEM
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Tokyo
Springer
[2017]
|
| Subjects: | |
| Physical Description: | xviii, 333 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9784431565000 |
Staff View
MARC
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| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
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Record in the Search Index
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| author | Tanaka, Nobuo 1949- |
| author_GND | (DE-588)1063671906 |
| author_facet | Tanaka, Nobuo 1949- |
| author_role | aut |
| author_sort | Tanaka, Nobuo 1949- |
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| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
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| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
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| id | DE-604.BV044342528 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:50:17Z |
| institution | BVB |
| isbn | 9784431565000 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029745538 |
| oclc_num | 987974851 |
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| owner_facet | DE-11 |
| physical | xviii, 333 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Springer |
| record_format | marc |
| spelling | Tanaka, Nobuo 1949- Verfasser (DE-588)1063671906 aut Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka Tokyo Springer [2017] © 2017 xviii, 333 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology Erscheint auch als Online-Ausgabe 978-4-431-56502-4 |
| spellingShingle | Tanaka, Nobuo 1949- Electron nano-imaging basics of imaging and diffraction for TEM and STEM Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| title | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_auth | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_exact_search | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_full | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_fullStr | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_full_unstemmed | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_short | Electron nano-imaging |
| title_sort | electron nano imaging basics of imaging and diffraction for tem and stem |
| title_sub | basics of imaging and diffraction for TEM and STEM |
| topic | Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| topic_facet | Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| work_keys_str_mv | AT tanakanobuo electronnanoimagingbasicsofimaginganddiffractionfortemandstem |