Electron nano-imaging: basics of imaging and diffraction for TEM and STEM
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer
[2017]
|
| Schlagworte: | |
| Beschreibung: | xviii, 333 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9784431565000 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV044342528 | ||
| 003 | DE-604 | ||
| 005 | 20190116 | ||
| 007 | t | ||
| 008 | 170608s2017 a||| |||| 00||| eng d | ||
| 020 | |a 9784431565000 |c hbk. |9 978-4-431-56500-0 | ||
| 035 | |a (OCoLC)987974851 | ||
| 035 | |a (DE-599)BVBBV044342528 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 | ||
| 082 | 0 | |a 620.11 |2 23 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 100 | 1 | |a Tanaka, Nobuo |d 1949- |e Verfasser |0 (DE-588)1063671906 |4 aut | |
| 245 | 1 | 0 | |a Electron nano-imaging |b basics of imaging and diffraction for TEM and STEM |c Nobuo Tanaka |
| 264 | 1 | |a Tokyo |b Springer |c [2017] | |
| 264 | 4 | |c © 2017 | |
| 300 | |a xviii, 333 Seiten |b Illustrationen, Diagramme (teilweise farbig) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Nanoscale science | |
| 650 | 4 | |a Nanoscience | |
| 650 | 4 | |a Nanostructures | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
| 650 | 4 | |a Nanoscale Science and Technology | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-4-431-56502-4 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029745538 | ||
Datensatz im Suchindex
| _version_ | 1804177577065054208 |
|---|---|
| any_adam_object | |
| author | Tanaka, Nobuo 1949- |
| author_GND | (DE-588)1063671906 |
| author_facet | Tanaka, Nobuo 1949- |
| author_role | aut |
| author_sort | Tanaka, Nobuo 1949- |
| author_variant | n t nt |
| building | Verbundindex |
| bvnumber | BV044342528 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)987974851 (DE-599)BVBBV044342528 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV044342528 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:50:17Z |
| institution | BVB |
| isbn | 9784431565000 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029745538 |
| oclc_num | 987974851 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | xviii, 333 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Springer |
| record_format | marc |
| spelling | Tanaka, Nobuo 1949- Verfasser (DE-588)1063671906 aut Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka Tokyo Springer [2017] © 2017 xviii, 333 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology Erscheint auch als Online-Ausgabe 978-4-431-56502-4 |
| spellingShingle | Tanaka, Nobuo 1949- Electron nano-imaging basics of imaging and diffraction for TEM and STEM Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| title | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_auth | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_exact_search | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_full | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_fullStr | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_full_unstemmed | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_short | Electron nano-imaging |
| title_sort | electron nano imaging basics of imaging and diffraction for tem and stem |
| title_sub | basics of imaging and diffraction for TEM and STEM |
| topic | Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| topic_facet | Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| work_keys_str_mv | AT tanakanobuo electronnanoimagingbasicsofimaginganddiffractionfortemandstem |