Semiconductor devices in harsh conditions:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boca Raton, Fla.
CRC Press, Taylor & Francis
[2017]
|
| Schriftenreihe: | Devices, circuits, and systems
|
| Schlagworte: | |
| Beschreibung: | XXII, 234 Seiten Illustrationen, Diagramme |
| ISBN: | 9781498743808 |
Internformat
MARC
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| 003 | DE-604 | ||
| 005 | 20170712 | ||
| 007 | t | ||
| 008 | 170519s2017 a||| |||| 00||| eng d | ||
| 020 | |a 9781498743808 |c hbk |9 978-1-4987-4380-8 | ||
| 035 | |a (OCoLC)987153072 | ||
| 035 | |a (DE-599)BVBBV044319492 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 245 | 1 | 0 | |a Semiconductor devices in harsh conditions |c edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske, ... |
| 264 | 1 | |a Boca Raton, Fla. |b CRC Press, Taylor & Francis |c [2017] | |
| 300 | |a XXII, 234 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Devices, circuits, and systems | |
| 650 | 4 | |a HALBLEITER + HALBLEITERTECHNOLOGIE (ELEKTROTECHNIK) | |
| 650 | 4 | |a ZUVERLÄSSIGKEIT + TESTEN + FEHLERTOLERANZ (HARDWARE) | |
| 650 | 4 | |a IONISIERENDE STRAHLUNG (RADIOCHEMIE) | |
| 650 | 4 | |a SEMI-CONDUCTEURS + TECHNOLOGIE DES SEMI-CONDUCTEURS (ÉLECTROTECHNIQUE) | |
| 650 | 4 | |a SEMICONDUCTORS + SEMICONDUCTOR TECHNOLOGY (ELECTRICAL ENGINEERING) | |
| 650 | 4 | |a RELIABILITY + TESTING + FAULT TOLERANCE (HARDWARE) | |
| 650 | 4 | |a FIABILITÉ + ESSAIS + TOLÉRANCE AUX PANNES (HARDWARE) | |
| 650 | 4 | |a RAYONS IONISANTS (RADIOCHIMIE) | |
| 650 | 4 | |a IONIZING RADIATION (RADIOCHEMISTRY) | |
| 650 | 4 | |a Semiconductors / Reliability | |
| 650 | 4 | |a Extreme environments | |
| 650 | 4 | |a Environmental testing | |
| 700 | 1 | |a Weide-Zaage, Kirsten |e Sonstige |0 (DE-588)1022921096 |4 oth | |
| 700 | 1 | |a Chrzanowska-Jeske, M. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029722990 | ||
Datensatz im Suchindex
| _version_ | 1804177536751501312 |
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| any_adam_object | |
| author_GND | (DE-588)1022921096 |
| building | Verbundindex |
| bvnumber | BV044319492 |
| ctrlnum | (OCoLC)987153072 (DE-599)BVBBV044319492 |
| format | Book |
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| id | DE-604.BV044319492 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:49:38Z |
| institution | BVB |
| isbn | 9781498743808 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029722990 |
| oclc_num | 987153072 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XXII, 234 Seiten Illustrationen, Diagramme |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | CRC Press, Taylor & Francis |
| record_format | marc |
| series2 | Devices, circuits, and systems |
| spelling | Semiconductor devices in harsh conditions edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske, ... Boca Raton, Fla. CRC Press, Taylor & Francis [2017] XXII, 234 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Devices, circuits, and systems HALBLEITER + HALBLEITERTECHNOLOGIE (ELEKTROTECHNIK) ZUVERLÄSSIGKEIT + TESTEN + FEHLERTOLERANZ (HARDWARE) IONISIERENDE STRAHLUNG (RADIOCHEMIE) SEMI-CONDUCTEURS + TECHNOLOGIE DES SEMI-CONDUCTEURS (ÉLECTROTECHNIQUE) SEMICONDUCTORS + SEMICONDUCTOR TECHNOLOGY (ELECTRICAL ENGINEERING) RELIABILITY + TESTING + FAULT TOLERANCE (HARDWARE) FIABILITÉ + ESSAIS + TOLÉRANCE AUX PANNES (HARDWARE) RAYONS IONISANTS (RADIOCHIMIE) IONIZING RADIATION (RADIOCHEMISTRY) Semiconductors / Reliability Extreme environments Environmental testing Weide-Zaage, Kirsten Sonstige (DE-588)1022921096 oth Chrzanowska-Jeske, M. Sonstige oth |
| spellingShingle | Semiconductor devices in harsh conditions HALBLEITER + HALBLEITERTECHNOLOGIE (ELEKTROTECHNIK) ZUVERLÄSSIGKEIT + TESTEN + FEHLERTOLERANZ (HARDWARE) IONISIERENDE STRAHLUNG (RADIOCHEMIE) SEMI-CONDUCTEURS + TECHNOLOGIE DES SEMI-CONDUCTEURS (ÉLECTROTECHNIQUE) SEMICONDUCTORS + SEMICONDUCTOR TECHNOLOGY (ELECTRICAL ENGINEERING) RELIABILITY + TESTING + FAULT TOLERANCE (HARDWARE) FIABILITÉ + ESSAIS + TOLÉRANCE AUX PANNES (HARDWARE) RAYONS IONISANTS (RADIOCHIMIE) IONIZING RADIATION (RADIOCHEMISTRY) Semiconductors / Reliability Extreme environments Environmental testing |
| title | Semiconductor devices in harsh conditions |
| title_auth | Semiconductor devices in harsh conditions |
| title_exact_search | Semiconductor devices in harsh conditions |
| title_full | Semiconductor devices in harsh conditions edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske, ... |
| title_fullStr | Semiconductor devices in harsh conditions edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske, ... |
| title_full_unstemmed | Semiconductor devices in harsh conditions edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske, ... |
| title_short | Semiconductor devices in harsh conditions |
| title_sort | semiconductor devices in harsh conditions |
| topic | HALBLEITER + HALBLEITERTECHNOLOGIE (ELEKTROTECHNIK) ZUVERLÄSSIGKEIT + TESTEN + FEHLERTOLERANZ (HARDWARE) IONISIERENDE STRAHLUNG (RADIOCHEMIE) SEMI-CONDUCTEURS + TECHNOLOGIE DES SEMI-CONDUCTEURS (ÉLECTROTECHNIQUE) SEMICONDUCTORS + SEMICONDUCTOR TECHNOLOGY (ELECTRICAL ENGINEERING) RELIABILITY + TESTING + FAULT TOLERANCE (HARDWARE) FIABILITÉ + ESSAIS + TOLÉRANCE AUX PANNES (HARDWARE) RAYONS IONISANTS (RADIOCHIMIE) IONIZING RADIATION (RADIOCHEMISTRY) Semiconductors / Reliability Extreme environments Environmental testing |
| topic_facet | HALBLEITER + HALBLEITERTECHNOLOGIE (ELEKTROTECHNIK) ZUVERLÄSSIGKEIT + TESTEN + FEHLERTOLERANZ (HARDWARE) IONISIERENDE STRAHLUNG (RADIOCHEMIE) SEMI-CONDUCTEURS + TECHNOLOGIE DES SEMI-CONDUCTEURS (ÉLECTROTECHNIQUE) SEMICONDUCTORS + SEMICONDUCTOR TECHNOLOGY (ELECTRICAL ENGINEERING) RELIABILITY + TESTING + FAULT TOLERANCE (HARDWARE) FIABILITÉ + ESSAIS + TOLÉRANCE AUX PANNES (HARDWARE) RAYONS IONISANTS (RADIOCHIMIE) IONIZING RADIATION (RADIOCHEMISTRY) Semiconductors / Reliability Extreme environments Environmental testing |
| work_keys_str_mv | AT weidezaagekirsten semiconductordevicesinharshconditions AT chrzanowskajeskem semiconductordevicesinharshconditions |