Holdings: Testing of interposer-based 2.5D integrated circuits

Testing of interposer-based 2.5D integrated circuits:

Saved in:

Bibliographic Details
Main Authors:	Wang, Ran (Author), Chakrabarty, Krishnendu (Author)
Format:	Electronic eBook
Language:	English
Published:	Cham Springer 2017
Subjects:	Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften
Online Access:	BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 TUM01 UBY01 Volltext
Physical Description:	1 Online-Ressource (xiv, 182 Seiten) Illustrationen, Diagramme
ISBN:	9783319547145
DOI:	10.1007/978-3-319-54714-5

Staff View

MARC


LEADER	00000nmm a2200000zc 4500
001	BV044257710
003	DE-604
005	20190204
007	cr\|uuu---uuuuu
008	170403s2017 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9783319547145 \|c Online \|9 978-3-319-54714-5
024	7		\|a 10.1007/978-3-319-54714-5 \|2 doi
035			\|a (ZDB-2-ENG)9783319547145
035			\|a (OCoLC)992455770
035			\|a (DE-599)BVBBV044257710
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-859 \|a DE-860 \|a DE-91 \|a DE-1046 \|a DE-1043 \|a DE-Aug4 \|a DE-898 \|a DE-861 \|a DE-573 \|a DE-863 \|a DE-706 \|a DE-634 \|a DE-862 \|a DE-92
082	0		\|a 621.3815 \|2 23
084			\|a ELT 000 \|2 stub
084			\|a MAS 000 \|2 stub
100	1		\|a Wang, Ran \|e Verfasser \|4 aut
245	1	0	\|a Testing of interposer-based 2.5D integrated circuits \|c Ran Wang, Krishnendu Chakrabarty
264		1	\|a Cham \|b Springer \|c 2017
300			\|a 1 Online-Ressource (xiv, 182 Seiten) \|b Illustrationen, Diagramme
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
650		4	\|a Engineering
650		4	\|a Logic design
650		4	\|a Microprocessors
650		4	\|a Electronic circuits
650		4	\|a Circuits and Systems
650		4	\|a Processor Architectures
650		4	\|a Logic Design
650		4	\|a Ingenieurwissenschaften
700	1		\|a Chakrabarty, Krishnendu \|e Verfasser \|4 aut
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-319-54713-8
856	4	0	\|u https://doi.org/10.1007/978-3-319-54714-5 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
912			\|a ZDB-2-ENG
940	1		\|q ZDB-2-ENG_2017
999			\|a oai:aleph.bib-bvb.de:BVB01-029662718
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l BTU01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FAB01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FAW01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FHA01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FHI01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FHN01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FHR01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FKE01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FLA01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FRO01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FWS01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l FWS02 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l TUM01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-54714-5 \|l UBY01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext

Record in the Search Index

DE-BY-FWS_katkey	644232
_version_	1824554592629686272
any_adam_object
author	Wang, Ran Chakrabarty, Krishnendu
author_facet	Wang, Ran Chakrabarty, Krishnendu
author_role	aut aut
author_sort	Wang, Ran
author_variant	r w rw k c kc
building	Verbundindex
bvnumber	BV044257710
classification_tum	ELT 000 MAS 000
collection	ZDB-2-ENG
ctrlnum	(ZDB-2-ENG)9783319547145 (OCoLC)992455770 (DE-599)BVBBV044257710
dewey-full	621.3815
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815
dewey-search	621.3815
dewey-sort	3621.3815
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau
doi_str_mv	10.1007/978-3-319-54714-5
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02947nmm a2200637zc 4500</leader><controlfield tag="001">BV044257710</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20190204 </controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">170403s2017 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319547145</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-54714-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-54714-5</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783319547145</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)992455770</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044257710</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-859</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wang, Ran</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Testing of interposer-based 2.5D integrated circuits</subfield><subfield code="c">Ran Wang, Krishnendu Chakrabarty</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield><subfield code="c">2017</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xiv, 182 Seiten)</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Logic design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microprocessors</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Processor Architectures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Logic Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chakrabarty, Krishnendu</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-54713-8</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2017</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029662718</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-54714-5</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV044257710
illustrated	Not Illustrated
indexdate	2025-02-20T06:54:13Z
institution	BVB
isbn	9783319547145
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-029662718
oclc_num	992455770
open_access_boolean
owner	DE-859 DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-573 DE-863 DE-BY-FWS DE-706 DE-634 DE-862 DE-BY-FWS DE-92
owner_facet	DE-859 DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-573 DE-863 DE-BY-FWS DE-706 DE-634 DE-862 DE-BY-FWS DE-92
physical	1 Online-Ressource (xiv, 182 Seiten) Illustrationen, Diagramme
psigel	ZDB-2-ENG ZDB-2-ENG_2017
publishDate	2017
publishDateSearch	2017
publishDateSort	2017
publisher	Springer
record_format	marc
spellingShingle	Wang, Ran Chakrabarty, Krishnendu Testing of interposer-based 2.5D integrated circuits Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften
title	Testing of interposer-based 2.5D integrated circuits
title_auth	Testing of interposer-based 2.5D integrated circuits
title_exact_search	Testing of interposer-based 2.5D integrated circuits
title_full	Testing of interposer-based 2.5D integrated circuits Ran Wang, Krishnendu Chakrabarty
title_fullStr	Testing of interposer-based 2.5D integrated circuits Ran Wang, Krishnendu Chakrabarty
title_full_unstemmed	Testing of interposer-based 2.5D integrated circuits Ran Wang, Krishnendu Chakrabarty
title_short	Testing of interposer-based 2.5D integrated circuits
title_sort	testing of interposer based 2 5d integrated circuits
topic	Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften
topic_facet	Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften
url	https://doi.org/10.1007/978-3-319-54714-5
work_keys_str_mv	AT wangran testingofinterposerbased25dintegratedcircuits AT chakrabartykrishnendu testingofinterposerbased25dintegratedcircuits

Holdings

Get full text

MARC

Record in the Search Index

Similar Items