Testing of interposer-based 2.5D integrated circuits:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
2017
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| Schlagworte: | |
| Online-Zugang: | BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 TUM01 UBY01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (xiv, 182 Seiten) Illustrationen, Diagramme |
| ISBN: | 9783319547145 |
| DOI: | 10.1007/978-3-319-54714-5 |
Internformat
MARC
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| 650 | 4 | |a Ingenieurwissenschaften | |
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Datensatz im Suchindex
| DE-BY-FWS_katkey | 644232 |
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| _version_ | 1806181074867322880 |
| any_adam_object | |
| author | Wang, Ran Chakrabarty, Krishnendu |
| author_facet | Wang, Ran Chakrabarty, Krishnendu |
| author_role | aut aut |
| author_sort | Wang, Ran |
| author_variant | r w rw k c kc |
| building | Verbundindex |
| bvnumber | BV044257710 |
| classification_tum | ELT 000 MAS 000 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)9783319547145 (OCoLC)992455770 (DE-599)BVBBV044257710 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-319-54714-5 |
| format | Electronic eBook |
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| id | DE-604.BV044257710 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T12:35:01Z |
| institution | BVB |
| isbn | 9783319547145 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029662718 |
| oclc_num | 992455770 |
| open_access_boolean | |
| owner | DE-859 DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-573 DE-863 DE-BY-FWS DE-706 DE-634 DE-862 DE-BY-FWS DE-92 |
| owner_facet | DE-859 DE-860 DE-91 DE-BY-TUM DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-573 DE-863 DE-BY-FWS DE-706 DE-634 DE-862 DE-BY-FWS DE-92 |
| physical | 1 Online-Ressource (xiv, 182 Seiten) Illustrationen, Diagramme |
| psigel | ZDB-2-ENG ZDB-2-ENG_2017 |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Springer |
| record_format | marc |
| spellingShingle | Wang, Ran Chakrabarty, Krishnendu Testing of interposer-based 2.5D integrated circuits Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften |
| title | Testing of interposer-based 2.5D integrated circuits |
| title_auth | Testing of interposer-based 2.5D integrated circuits |
| title_exact_search | Testing of interposer-based 2.5D integrated circuits |
| title_full | Testing of interposer-based 2.5D integrated circuits Ran Wang, Krishnendu Chakrabarty |
| title_fullStr | Testing of interposer-based 2.5D integrated circuits Ran Wang, Krishnendu Chakrabarty |
| title_full_unstemmed | Testing of interposer-based 2.5D integrated circuits Ran Wang, Krishnendu Chakrabarty |
| title_short | Testing of interposer-based 2.5D integrated circuits |
| title_sort | testing of interposer based 2 5d integrated circuits |
| topic | Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften |
| topic_facet | Engineering Logic design Microprocessors Electronic circuits Circuits and Systems Processor Architectures Logic Design Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-3-319-54714-5 |
| work_keys_str_mv | AT wangran testingofinterposerbased25dintegratedcircuits AT chakrabartykrishnendu testingofinterposerbased25dintegratedcircuits |