Metrology and diagnostic techniques for nanoelectronics:
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Pan Stanford Publishing
[2017]
|
| Schlagworte: | |
| Beschreibung: | xli, 1411 Seiten Illustrationen, Diagramme 24 cm |
| ISBN: | 9814745081 9789814745086 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV044227617 | ||
| 003 | DE-604 | ||
| 005 | 20170403 | ||
| 007 | t | ||
| 008 | 170316s2016 a||| |||| 00||| eng d | ||
| 020 | |a 9814745081 |9 9814745081 | ||
| 020 | |a 9789814745086 |9 978-981-4745-08-6 | ||
| 035 | |a (OCoLC)992465615 | ||
| 035 | |a (DE-599)BVBBV044227617 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 245 | 1 | 0 | |a Metrology and diagnostic techniques for nanoelectronics |c edited by Zhiyong Ma, David G. Seiler |
| 264 | 1 | |a Singapore |b Pan Stanford Publishing |c [2017] | |
| 264 | 4 | |c © 2017 | |
| 300 | |a xli, 1411 Seiten |b Illustrationen, Diagramme |c 24 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 653 | 0 | |a Nanoelectronics | |
| 653 | 0 | |a Metrology | |
| 700 | 1 | |a Ma, Zhiyong |4 edt | |
| 700 | 1 | |a Seiler, David G. |4 edt | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029633364 | ||
Datensatz im Suchindex
| _version_ | 1804177379908648960 |
|---|---|
| any_adam_object | |
| author2 | Ma, Zhiyong Seiler, David G. |
| author2_role | edt edt |
| author2_variant | z m zm d g s dg dgs |
| author_facet | Ma, Zhiyong Seiler, David G. |
| building | Verbundindex |
| bvnumber | BV044227617 |
| ctrlnum | (OCoLC)992465615 (DE-599)BVBBV044227617 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00936nam a2200313 c 4500</leader><controlfield tag="001">BV044227617</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20170403 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">170316s2016 a||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814745081</subfield><subfield code="9">9814745081</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814745086</subfield><subfield code="9">978-981-4745-08-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)992465615</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044227617</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Metrology and diagnostic techniques for nanoelectronics</subfield><subfield code="c">edited by Zhiyong Ma, David G. Seiler</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Pan Stanford Publishing</subfield><subfield code="c">[2017]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2017</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xli, 1411 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield><subfield code="c">24 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Nanoelectronics</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Metrology</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ma, Zhiyong</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Seiler, David G.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029633364</subfield></datafield></record></collection> |
| id | DE-604.BV044227617 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:47:09Z |
| institution | BVB |
| isbn | 9814745081 9789814745086 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029633364 |
| oclc_num | 992465615 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | xli, 1411 Seiten Illustrationen, Diagramme 24 cm |
| publishDate | 2017 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Pan Stanford Publishing |
| record_format | marc |
| spelling | Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler Singapore Pan Stanford Publishing [2017] © 2017 xli, 1411 Seiten Illustrationen, Diagramme 24 cm txt rdacontent n rdamedia nc rdacarrier Nanoelectronics Metrology Ma, Zhiyong edt Seiler, David G. edt |
| spellingShingle | Metrology and diagnostic techniques for nanoelectronics |
| title | Metrology and diagnostic techniques for nanoelectronics |
| title_auth | Metrology and diagnostic techniques for nanoelectronics |
| title_exact_search | Metrology and diagnostic techniques for nanoelectronics |
| title_full | Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler |
| title_fullStr | Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler |
| title_full_unstemmed | Metrology and diagnostic techniques for nanoelectronics edited by Zhiyong Ma, David G. Seiler |
| title_short | Metrology and diagnostic techniques for nanoelectronics |
| title_sort | metrology and diagnostic techniques for nanoelectronics |
| work_keys_str_mv | AT mazhiyong metrologyanddiagnostictechniquesfornanoelectronics AT seilerdavidg metrologyanddiagnostictechniquesfornanoelectronics |