Introduction to optical testing:
This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1993
|
| Schriftenreihe: | SPIE tutorial texts
TT15 |
| Schlagworte: | |
| Online-Zugang: | FHD01 Volltext |
| Zusammenfassung: | This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations |
| Beschreibung: | 1 online resource (xii, 149 pages) illustrations |
| ISBN: | 9780819480996 |
| DOI: | 10.1117/3.147225 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044222671 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170313s1993 |||| o||u| ||||||eng d | ||
| 020 | |a 9780819480996 |9 978-0-8194-8099-6 | ||
| 024 | 7 | |a 10.1117/3.147225 |2 doi | |
| 035 | |a (ZDB-50-SPI)9780819480996 | ||
| 035 | |a (OCoLC)812344549 | ||
| 035 | |a (DE-599)BVBBV044222671 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1050 | ||
| 082 | 0 | |a 681/.4/0287 | |
| 084 | |a ZQ 3910 |0 (DE-625)158088: |2 rvk | ||
| 100 | 1 | |a Geary, Joseph M. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Introduction to optical testing |c Joseph M. Geary |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1993 | |
| 300 | |a 1 online resource (xii, 149 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a SPIE tutorial texts |v TT15 | |
| 520 | |a This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations | ||
| 650 | 4 | |a Optical instruments / Testing | |
| 650 | 4 | |a Electronic instruments | |
| 650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-0-8194-1377-2 |
| 856 | 4 | 0 | |u https://doi.org/10.1117/3.147225 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-50-SPI | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029628582 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://doi.org/10.1117/3.147225 |l FHD01 |p ZDB-50-SPI |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804177371541012480 |
|---|---|
| any_adam_object | |
| author | Geary, Joseph M. |
| author_facet | Geary, Joseph M. |
| author_role | aut |
| author_sort | Geary, Joseph M. |
| author_variant | j m g jm jmg |
| building | Verbundindex |
| bvnumber | BV044222671 |
| classification_rvk | ZQ 3910 |
| collection | ZDB-50-SPI |
| ctrlnum | (ZDB-50-SPI)9780819480996 (OCoLC)812344549 (DE-599)BVBBV044222671 |
| dewey-full | 681/.4/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 681 - Precision instruments and other devices |
| dewey-raw | 681/.4/0287 |
| dewey-search | 681/.4/0287 |
| dewey-sort | 3681 14 3287 |
| dewey-tens | 680 - Manufacture of products for specific uses |
| discipline | Handwerk und Gewerbe / Verschiedene Technologien Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| doi_str_mv | 10.1117/3.147225 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02232nmm a2200445zcb4500</leader><controlfield tag="001">BV044222671</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170313s1993 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780819480996</subfield><subfield code="9">978-0-8194-8099-6</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1117/3.147225</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-50-SPI)9780819480996</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)812344549</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044222671</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1050</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">681/.4/0287</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3910</subfield><subfield code="0">(DE-625)158088:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Geary, Joseph M.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Introduction to optical testing</subfield><subfield code="c">Joseph M. Geary</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xii, 149 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">SPIE tutorial texts</subfield><subfield code="v">TT15</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical instruments / Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic instruments</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-0-8194-1377-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1117/3.147225</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-50-SPI</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029628582</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1117/3.147225</subfield><subfield code="l">FHD01</subfield><subfield code="p">ZDB-50-SPI</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044222671 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:47:01Z |
| institution | BVB |
| isbn | 9780819480996 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029628582 |
| oclc_num | 812344549 |
| open_access_boolean | |
| owner | DE-1050 |
| owner_facet | DE-1050 |
| physical | 1 online resource (xii, 149 pages) illustrations |
| psigel | ZDB-50-SPI |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | SPIE |
| record_format | marc |
| series2 | SPIE tutorial texts |
| spelling | Geary, Joseph M. Verfasser aut Introduction to optical testing Joseph M. Geary Bellingham, Wash. SPIE 1993 1 online resource (xii, 149 pages) illustrations txt rdacontent c rdamedia cr rdacarrier SPIE tutorial texts TT15 This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations Optical instruments / Testing Electronic instruments Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Optische Messtechnik (DE-588)4172667-4 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 978-0-8194-1377-2 https://doi.org/10.1117/3.147225 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Geary, Joseph M. Introduction to optical testing Optical instruments / Testing Electronic instruments Optische Messtechnik (DE-588)4172667-4 gnd |
| subject_GND | (DE-588)4172667-4 |
| title | Introduction to optical testing |
| title_auth | Introduction to optical testing |
| title_exact_search | Introduction to optical testing |
| title_full | Introduction to optical testing Joseph M. Geary |
| title_fullStr | Introduction to optical testing Joseph M. Geary |
| title_full_unstemmed | Introduction to optical testing Joseph M. Geary |
| title_short | Introduction to optical testing |
| title_sort | introduction to optical testing |
| topic | Optical instruments / Testing Electronic instruments Optische Messtechnik (DE-588)4172667-4 gnd |
| topic_facet | Optical instruments / Testing Electronic instruments Optische Messtechnik |
| url | https://doi.org/10.1117/3.147225 |
| work_keys_str_mv | AT gearyjosephm introductiontoopticaltesting |