Optical imaging in projection microlithography:

Here for the first time is an integrated mathematical view of the physics and numerical modeling of optical projection lithography that efficiently covers the full spectrum of the important concepts. Alfred Wong offers rigorous underpinning, clarity in systematic formulation, physical insight into e...

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Bibliographic Details
Main Author: Wong, Alfred Kwok-Kit (Author)
Format: Electronic eBook
Language:English
Published: Bellingham, Wash. SPIE [2005]
Series:SPIE tutorial texts TT66
Subjects:
Online Access:FHD01
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Summary:Here for the first time is an integrated mathematical view of the physics and numerical modeling of optical projection lithography that efficiently covers the full spectrum of the important concepts. Alfred Wong offers rigorous underpinning, clarity in systematic formulation, physical insight into emerging ideas, as well as a system-level view of the parameter tolerances required in manufacturing. Readers with a good working knowledge of calculus can follow the step-by-step development, and technologists can gather general concepts and the key equations that result. Even the casual reader will gain a perspective on the key concepts, which will likely help facilitate dialog among technologists
Physical Description:1 online resource (xix, 254 pages) illustrations
ISBN:9780819478702
DOI:10.1117/3.612961

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