Scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer
[2018]
|
| Ausgabe: | Fourth edition |
| Schlagworte: | |
| Beschreibung: | XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9781493966745 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV044210672 | ||
| 003 | DE-604 | ||
| 005 | 20241204 | ||
| 007 | t| | ||
| 008 | 170306s2018 xxua||| |||| 00||| eng d | ||
| 020 | |a 9781493966745 |c hbk. |9 978-1-4939-6674-5 | ||
| 035 | |a (OCoLC)254505502 | ||
| 035 | |a (DE-599)BV044210672 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-19 |a DE-11 |a DE-703 |a DE-20 |a DE-29 |a DE-384 |a DE-634 |a DE-578 |a DE-706 |a DE-1043 |a DE-355 | ||
| 050 | 0 | |a QH212.S3 | |
| 082 | 0 | |a 502.825 | |
| 084 | |a YV 5017 |0 (DE-625)154225:12923 |2 rvk | ||
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 084 | |a UH 6320 |0 (DE-625)145762: |2 rvk | ||
| 084 | |a VG 9900 |0 (DE-625)147245:253 |2 rvk | ||
| 084 | |a CHE 264f |2 stub | ||
| 084 | |a PHY 135f |2 stub | ||
| 100 | 1 | |a Goldstein, Joseph |d 1939-2015 |0 (DE-588)1023852381 |4 aut | |
| 245 | 1 | 0 | |a Scanning electron microscopy and x-ray microanalysis |c Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
| 250 | |a Fourth edition | ||
| 264 | 1 | |a New York, NY |b Springer |c [2018] | |
| 264 | 4 | |c © 2018 | |
| 300 | |a XXIII, 550 Seiten |b Illustrationen, Diagramme (teilweise farbig) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 4 | |a X-ray microanalysis | |
| 650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 1 | 1 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 700 | 1 | |a Newbury, Dale E. |4 aut | |
| 700 | 1 | |a Michael, Joseph R. |4 aut | |
| 700 | 1 | |a Ritchie, Nicholas W. M. |4 aut | |
| 700 | 1 | |a Scott, John Henry J. |4 aut | |
| 700 | 1 | |a Joy, David C. |d 1943- |0 (DE-588)17217242X |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, eBook |z 978-1-4939-6676-9 |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029616953 | |
Datensatz im Suchindex
| _version_ | 1817507309847314432 |
|---|---|
| adam_text | |
| any_adam_object | |
| author | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- |
| author_GND | (DE-588)1023852381 (DE-588)17217242X |
| author_facet | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- |
| author_role | aut aut aut aut aut aut |
| author_sort | Goldstein, Joseph 1939-2015 |
| author_variant | j g jg d e n de den j r m jr jrm n w m r nwm nwmr j h j s jhj jhjs d c j dc dcj |
| building | Verbundindex |
| bvnumber | BV044210672 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S3 |
| callnumber-search | QH212.S3 |
| callnumber-sort | QH 3212 S3 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | YV 5017 UH 6310 UH 6320 VG 9900 |
| classification_tum | CHE 264f PHY 135f |
| ctrlnum | (OCoLC)254505502 (DE-599)BV044210672 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Chemie / Pharmazie Allgemeine Naturwissenschaft Physik Chemie Medizin |
| edition | Fourth edition |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV044210672</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20241204</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">170306s2018 xxua||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781493966745</subfield><subfield code="c">hbk.</subfield><subfield code="9">978-1-4939-6674-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)254505502</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BV044210672</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-19</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-578</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-355</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.S3</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.825</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">YV 5017</subfield><subfield code="0">(DE-625)154225:12923</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6320</subfield><subfield code="0">(DE-625)145762:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9900</subfield><subfield code="0">(DE-625)147245:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">CHE 264f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Goldstein, Joseph</subfield><subfield code="d">1939-2015</subfield><subfield code="0">(DE-588)1023852381</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning electron microscopy and x-ray microanalysis</subfield><subfield code="c">Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Fourth edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">[2018]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2018</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXIII, 550 Seiten</subfield><subfield code="b">Illustrationen, Diagramme (teilweise farbig)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-ray microanalysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Raster-Transmissions-Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4320991-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Raster-Transmissions-Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4320991-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Newbury, Dale E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Michael, Joseph R.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ritchie, Nicholas W. M.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Scott, John Henry J.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Joy, David C.</subfield><subfield code="d">1943-</subfield><subfield code="0">(DE-588)17217242X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe, eBook</subfield><subfield code="z">978-1-4939-6676-9</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029616953</subfield></datafield></record></collection> |
| id | DE-604.BV044210672 |
| illustrated | Illustrated |
| indexdate | 2024-12-04T11:00:41Z |
| institution | BVB |
| isbn | 9781493966745 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029616953 |
| oclc_num | 254505502 |
| open_access_boolean | |
| owner | DE-19 DE-BY-UBM DE-11 DE-703 DE-20 DE-29 DE-384 DE-634 DE-578 DE-706 DE-1043 DE-355 DE-BY-UBR |
| owner_facet | DE-19 DE-BY-UBM DE-11 DE-703 DE-20 DE-29 DE-384 DE-634 DE-578 DE-706 DE-1043 DE-355 DE-BY-UBR |
| physical | XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig) |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| spelling | Goldstein, Joseph 1939-2015 (DE-588)1023852381 aut Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy Fourth edition New York, NY Springer [2018] © 2018 XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s 1\p DE-604 Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 2\p DE-604 Newbury, Dale E. aut Michael, Joseph R. aut Ritchie, Nicholas W. M. aut Scott, John Henry J. aut Joy, David C. 1943- (DE-588)17217242X aut Erscheint auch als Online-Ausgabe, eBook 978-1-4939-6676-9 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- Scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4065579-9 (DE-588)4151898-6 (DE-588)4320991-9 (DE-588)4048455-5 |
| title | Scanning electron microscopy and x-ray microanalysis |
| title_auth | Scanning electron microscopy and x-ray microanalysis |
| title_exact_search | Scanning electron microscopy and x-ray microanalysis |
| title_full | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
| title_fullStr | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
| title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
| title_short | Scanning electron microscopy and x-ray microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis |
| topic | Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Scanning electron microscopy X-ray microanalysis Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie |
| work_keys_str_mv | AT goldsteinjoseph scanningelectronmicroscopyandxraymicroanalysis AT newburydalee scanningelectronmicroscopyandxraymicroanalysis AT michaeljosephr scanningelectronmicroscopyandxraymicroanalysis AT ritchienicholaswm scanningelectronmicroscopyandxraymicroanalysis AT scottjohnhenryj scanningelectronmicroscopyandxraymicroanalysis AT joydavidc scanningelectronmicroscopyandxraymicroanalysis |