ISTFA 2010: conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA
Gespeichert in:
Körperschaft: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Materials Park, Ohio
ASM International
2010
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Schlagworte: | |
Beschreibung: | Includes bibliographical references and index |
Beschreibung: | xix, 464 p. |
ISBN: | 9781615030415 0615030416 9781615037278 |
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author_corporate | International Symposium for Testing and Failure Analysis < 2010, Dallas, Tex.> |
author_corporate_role | aut |
author_facet | International Symposium for Testing and Failure Analysis < 2010, Dallas, Tex.> |
author_sort | International Symposium for Testing and Failure Analysis < 2010, Dallas, Tex.> |
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discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
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isbn | 9781615030415 0615030416 9781615037278 |
language | English |
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spelling | International Symposium for Testing and Failure Analysis < 2010, Dallas, Tex.> Verfasser aut ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International Materials Park, Ohio ASM International 2010 xix, 464 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
spellingShingle | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
subject_GND | (DE-588)1071861417 |
title | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA |
title_auth | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA |
title_exact_search | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA |
title_full | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International |
title_fullStr | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International |
title_full_unstemmed | ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International |
title_short | ISTFA 2010 |
title_sort | istfa 2010 conference proceedings from the 36th international symposium for testing and failure analysis november 14 18 2010 intercontinental hotel dallas dallas texas usa |
title_sub | conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA |
topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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