ISTFA 2009: conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, Ohio
Asm International
2009
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| Subjects: | |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | xvi, 355 p. |
| ISBN: | 1615030085 9781615030088 |
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MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044189573 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170220s2009 |||| o||u| ||||||eng d | ||
| 020 | |a 1615030085 |9 1-61503-008-5 | ||
| 020 | |a 9781615030088 |9 978-1-61503-008-8 | ||
| 035 | |a (ZDB-30-PAD)EBC3002438 | ||
| 035 | |a (ZDB-89-EBL)EBL3002438 | ||
| 035 | |a (OCoLC)872684611 | ||
| 035 | |a (DE-599)BVBBV044189573 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2009 |b conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| 264 | 1 | |a Materials Park, Ohio |b Asm International |c 2009 | |
| 300 | |a xvi, 355 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a ASM International |e Sonstige |4 oth | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029596364 | ||
Record in the Search Index
| _version_ | 1804177320728068096 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |
| author_sort | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> |
| building | Verbundindex |
| bvnumber | BV044189573 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC3002438 (ZDB-89-EBL)EBL3002438 (OCoLC)872684611 (DE-599)BVBBV044189573 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01535nmm a2200361zc 4500</leader><controlfield tag="001">BV044189573</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170220s2009 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1615030085</subfield><subfield code="9">1-61503-008-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781615030088</subfield><subfield code="9">978-1-61503-008-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC3002438</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL3002438</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)872684611</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044189573</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA 2009</subfield><subfield code="b">conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA</subfield><subfield code="c">sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, Ohio</subfield><subfield code="b">Asm International</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvi, 355 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029596364</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044189573 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:12Z |
| institution | BVB |
| isbn | 1615030085 9781615030088 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029596364 |
| oclc_num | 872684611 |
| open_access_boolean | |
| physical | xvi, 355 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Asm International |
| record_format | marc |
| spelling | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> Verfasser aut ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International Materials Park, Ohio Asm International 2009 xvi, 355 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_auth | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_full | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_fullStr | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_full_unstemmed | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_short | ISTFA 2009 |
| title_sort | istfa 2009 conference proceedings from the 35th international symposium for testing and failure analysis november 14 19 2009 san jose mcenery convention center san jose california usa |
| title_sub | conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| topic | Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses |
| topic_facet | Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT internationalsymposiumfortestingandfailureanalysis2009sanjosecalif istfa2009conferenceproceedingsfromthe35thinternationalsymposiumfortestingandfailureanalysisnovember14192009sanjosemceneryconventioncentersanjosecaliforniausa AT asminternational istfa2009conferenceproceedingsfromthe35thinternationalsymposiumfortestingandfailureanalysisnovember14192009sanjosemceneryconventioncentersanjosecaliforniausa AT electronicdevicefailureanalysissociety istfa2009conferenceproceedingsfromthe35thinternationalsymposiumfortestingandfailureanalysisnovember14192009sanjosemceneryconventioncentersanjosecaliforniausa |