ISTFA 2009: conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
Asm International
2009
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xvi, 355 p. |
| ISBN: | 1615030085 9781615030088 |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:12Z |
| institution | BVB |
| isbn | 1615030085 9781615030088 |
| language | English |
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| oclc_num | 872684611 |
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| physical | xvi, 355 p. |
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| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Asm International |
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| spelling | International Symposium for Testing and Failure Analysis < 2009, San Jose, Calif.> Verfasser aut ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International Materials Park, Ohio Asm International 2009 xvi, 355 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_auth | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| title_full | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_fullStr | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_full_unstemmed | ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International |
| title_short | ISTFA 2009 |
| title_sort | istfa 2009 conference proceedings from the 35th international symposium for testing and failure analysis november 14 19 2009 san jose mcenery convention center san jose california usa |
| title_sub | conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA |
| topic | Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses |
| topic_facet | Electronic apparatus and appliances Testing Congresses Electronics Materials Testing Congresses Konferenzschrift |
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